Abstract: A method of forming silicon dioxide layers by bias ECR is described. The layers are formed by reacting oxygen with TEOS or TMCTS. High-quality, void-free layerc can be formed over conductor patterns having high-aspect-ratio intermetallic spacings.
Type:
Grant
Filed:
April 11, 1991
Date of Patent:
June 23, 1992
Assignee:
AT&T Bell Laboratories
Inventors:
Pang-Dow Foo, Ajit S. Manocha, John F. Miner, Chien-Shing Pai