Abstract: A method for testing integrated circuit devices and electronic devices. An integrated circuit device has one or more electronic devices, each having a channel of a particular length. In order to test an integrated circuit device or an individual electronic device, a voltage is applied to the device under test. The amount of voltage applied is a function of the channel lengths of the device being tested and, in particular, it is a function of the shortest channel lengths existing in the device being tested. This ensures that a safe voltage is applied to the device being tested.