Abstract: A device for correcting measuring values of a group of radiation detectors for measuring the intensity or distribution of radiation, comprising an additional radiation source for direct irradiation of the detectors. The radiation of the said additional radiation source can be switched on each time when the radiation to be measured is not incident on the radiation detectors. The device furthermore comprises a calculating device which forms for each radiation detector the quotient of the measuring value (M1(x)) and the reference measuring value (M2(x)) of the radiaton detectors when exposed to the radiation of the additional radiation source.
Type:
Grant
Filed:
July 14, 1976
Date of Patent:
February 21, 1978
Assignee:
U.S. Philips Corporation
Inventors:
Dietrich Meyer-Ebrecht, Gunter Kowalski