Abstract: Methods and apparatus are disclosed determining the presence of base line popping noise for a read head inside an assembled disk drive, as well as, determining read bias conditions for operating the read head free of base line popping noise. These further include performance evaluation of the read head for read bias conditions free of base line popping noise. They also include repairing the read head using DC write current and read bias current within the assembled disk drive.
Type:
Grant
Filed:
August 22, 2002
Date of Patent:
December 7, 2004
Assignee:
Samsung Electronics Co., Ltd.
Inventors:
Jong Yun Yun, Jae June Kim, Chin Won Cho, Chang Dong Yeo