Abstract: A lighting device includes a light-guiding rod and a light-emitting unit. The light-guiding rod includes a transparent hollow housing, the housing has two open ends and two insulating plugs for closing corresponding said two open ends. The light-emitting unit includes a transparent light-guiding plate, at least one light-emitting diode, a mounting substrate, and a plurality of conductive bumps. The transparent light-guiding plate is disposed in said housing. At least one light-emitting diode has a light-emitting surface; the surface is attached to a lower surface of said light-guiding plate. The mounting substrate has a wiring surface and a plurality of electric traces. A plurality of conductive bumps for connecting electrically said electric contacts of said at least one light-emitting diode to corresponding said electric traces in such a manner that said at least one light-emitting diode is mounted on said wiring surface of said mounting substrate.

Abstract: An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal from the spectroscopy system and thus improves the noise performance of the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system comprises a semiconductor source and a tunable filter. The combination of the semiconductor source and tunable signal illuminate a sample with a tunable signal, being tunable over a scan band. The power control system comprises an amplitude detector system for detecting the power of the tunable optical signal and power control system for regulating the amplitude of the tunable optical signal in response to its detected power.

Abstract: An x-ray microscope uses a microfocus x-ray source with a focus spot of less than 10 micrometers and a Wolter condenser having a magnification of about four or more for concentrating x-rays from the source onto a sample. A detector is provided for detecting the x-rays after interaction with the sample, and an x-ray objective is used to form an image of the sample on the detector. The use of the Wolter optic addresses a problem with microfocus sources that arise when the size of the focal spot that must then be imaged onto the sample with the condenser is smaller than the field of view.

Abstract: A modulator includes an interferometer waveguide structure formed on an electro-optical substrate, preferably a Z-cut lithium niobate or a Z-cut lithium tantalate. The substrate includes a domain inversion between a region near the first arm and a region near the second arm of the interferometer waveguide structure. In one example, two coplanar strip electrode structures, each extending near at least a portion of the first arm and the second arm, respectively, are electrically coupled to each other.

Abstract: A low voltage electrical hermetic penetrant structure which provides input of electrical energy and signals in tight premises, such as in atomic power stations, nuclear vessels, underground, and the like. The hermetic penetrant structure includes hermetic modules sealed relative to a surrounding case. A metal pipe of each hermetic module includes longitudinally pressurized wires hermetically sealed inside the metal pipe through polysulphone and polyetheretherketon insulators. The polyetheretherketon insulators are positioned at the end portions of the wires. On the ends of each module an additional external insulator can be installed in the form of a socket of thermal-shrinkage pipe, filled with fire-resistant sealant.

Abstract: An apparatus and a corresponding method for reading out a storage phosphor plate (2) with an insertion device for inserting a cassette (1) in which a movably disposed support (3) is located, on top of which the storage phosphor plate (2) lies, a read-out device (20) for reading out the storage phosphor plate (2) and a conveyance device (11, 12) which takes the storage phosphor plate (2) from the support (3) and conveys it in a first direction (R) to the read-out device (20). In order to achieve the most precise and reliable alignment possible of the storage phosphor plate (2) relative to the read-out device (20) in a simple way, a positioning device (13) is provided for shifting the support (3), on which the storage phosphor plate (2) lies, in a second direction (A) which is different from the first direction (R) so that the support (3) and the storage phosphor plate (2) are aligned relative to the read-out device (20).

Abstract: A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.

Abstract: The invention is related to the systems of so-called “security entrance” and, in particular, to the systems for preventing the entry of forbidden articles and/or substances from an unprotected area to a protected one. The simplicity, efficiency and secrecy of examination in a security system for preventing the entry of forbidden articles and/or substances from a surrounding area to a protected one, said system comprised of a partitioning separating a protected area from an unprotected one, at least, one walk-gate made in said partitioning, an information control-and-processing device and a detector of forbidden articles and/or substances is achieved due to said detector of forbidden articles and/or substances made an X-ray kind to provide secret examination of every person passing through said walk-gate.

Abstract: A microscope system and a method that record spectra (60a, 61a, 62a, 63a, and 66a) of the dyes present in the specimen (15) using an SP module (20) are disclosed. A transformation of the data of the ascertained spectra, and of the dye spectra (60b, 61b, 62b, 63b, and 66b) stored in a database, is performed. The spectra are entered into a correspondingly into a divided transformation space. Allocation of the dye spectra (60b, 61b, 62b, 63b, and 66b) to the measured spectra (60a, 61a, 62a, 63a, and 66a) is accomplished by way of a comparison in the transformation space.

Abstract: An x-ray imaging system uses particular emission lines that are optimized for imaging specific metallic structures in a semiconductor integrated circuit structures and optimized for the use with specific optical elements and scintillator materials. Such a system is distinguished from currently-existing x-ray imaging systems that primarily use the integral of all emission lines and the broad Bremstralung radiation. The disclosed system provides favorable imaging characteristics such as ability to enhance the contrast of certain materials in a sample, to use different contrast mechanisms in a single imaging system, and to increase the throughput of the system.

Abstract: Disclosed is a method for analyzing biological samples by means of a scanning microscope. According to said method, at least one screen dot is repeatedly and successively illuminated with a manipulating light beam and an exciting light beam. The interval between the time of illumination with the manipulating light beam and the time of illumination with the exciting light beam is modified, and the fluorescent light yield is measured in accordance with said interval.

Abstract: A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.

Abstract: To determine an edge bead removal line (17) on a wafer (10), first lines or edges (38, 40, 42, 44) in the edge area (19) of the wafer (10) are detected. A first line area (48) and a second line area (50) are defined on either side of these lines (38, 40, 42, 44). The structures (36) present in these edge areas (48, 50) are compared to each other. From the result of the comparison it is determined whether or not an edge bead removal line (17) is present.

Abstract: Several methods for retrospective correction of intensity inhomogeneities in digital diagnostic radiation images are presented. The methods are based on the correction of a digital image representation by means of a bias field. The bias field is deduced from the digital image representation of the diagnostic radiation image.

Abstract: The invention concerns an electrical circuit for limiting the switching-on current through a load during a switching-on process, comprising an electrical component which is connected in series to the load. To ensure current limitation which is independent of the load and of the value of the supply voltage, and simultaneously to avoid switching current peaks and minimize dissipated heat, the current-limiting component is in the form of an active component which has an internal resistance, and which is controlled by a timing element in such a way that the internal resistance of the component is reduced during a switching-on process.

Abstract: The invention relates to a reflected-light microscope comprising a light source for generating an illumination light beam, which can be directed through a lens along an illumination beam path onto a sample. Said microscope is provided with imaging optics, which generate a plane that optically corresponds to the pupil plane. At least one attenuation element, which acts in an essentially uniform manner over the entire cross-section of the illumination light beam, can be introduced into the illumination beam path on the optically corresponding plane.

Abstract: This invention relates to technology of carbographite materials, in particular, to production of oxidized graphite for making low foaming temperature foamed graphite, which is used for manufacturing flexible foil, fireproof materials, water-purification sorbents, materials for cleaning up spills of petroleum products, and so on. The method for producing oxidized low foaming temperature graphite comprises the stages of (a) preparing a mixture based on graphite particles and at least one aqueous solution of an acid; (b) activating the surface of said graphite particles to produce acid-containing functional groups on the surface of the particles; (c) treating the graphite particles to produce a graphite intercalation compound; (d) washing said compound with water; (e) drying said compound, and heat-treating it to produce foamed graphite, wherein stage (b) and (c) are carried out by electrochemical treatment at a quantity of electricity within 300 to 600 mA·hour/g of graphite.

Abstract: A spectroscopy system comprises a tunable semiconductor laser, such as an external cavity laser, that generates a tunable signal. A detector is provided for detecting the tunable signal after interaction with a sample. In this way, the system is able to determine the spectroscopic response of the sample by tuning the laser of the scan band and monitoring the detector's response. An integrating device, such as an integrating sphere, is interposed optically between the tunable semiconductor laser and the detector. This integrating device is used to mitigate the effects of parasitic spectral noise, such as noise that is generated by speckle or the combination of single-and multi-mode optical fibers in the transmission link between the tunable semiconductor laser and the detector.

Abstract: A fabrication process for zone plate lenses is based on controlled thin layer deposition for fabricating structures as small as 2 nanometers (nm) in width, and potentially smaller. The substrate for deposition will take the form of a precision hole, fabricated in a substrate, such as silicon by electron beam lithography and subsequent reactive ion etching. A controlled layer deposition is then used to form the required zone plate structure. A subsequent thinning process is used to section the hole and produce a zone plate with the required layer thicknesses.

Abstract: Methods for fabricating refractive element(s) and aligning the elements in a compound optic, typically to a zone plate element. The techniques are used for fabricating micro refractive, such as Fresnel, optics and compound optics including two or more optical elements for short wavelength radiation. One application is the fabrication of the Achromatic Fresnel Optic (AFO). Techniques for fabricating the refractive element generally include: 1) ultra-high precision mechanical machining, e.g,. diamond turning; 2) lithographic techniques including gray-scale lithography and multi-step lithographic processes; 3) high-energy beam machining, such as electron-beam, focused ion beam, laser, and plasma-beam machining; and 4) photo-induced chemical etching techniques. Also addressed are methods of aligning the two optical elements during fabrication and methods of maintaining the alignment during subsequent operation.