Patents Represented by Attorney, Agent or Law Firm Hovey Williams
  • Patent number: 6507205
    Abstract: A tester to device-under-test interface is disclosed in which a PCB has a socket for a device under test (DUT), one or more cable connectors for cables from an IC tester, an interface matrix card slot having a plurality of contacts electrically connected to the DUT socket and the cable connector pins, and an interface matrix card having a plurality of horizontal and vertical conductors capable of being electrically connected to each other for mapping the proper connection of signals between the DUT socket and the tester cables.
    Type: Grant
    Filed: November 14, 2000
    Date of Patent: January 14, 2003
    Assignee: Xilinx, Inc.
    Inventors: Michael J. Dibish, Sunae Kang