Abstract: A method and system for dicing a semiconductor wafer providing a structure with greatly reduced backside chipping and cracking, as well as increased die strength. Semiconductor chip structures obtained from wafers diced according to this invention are also encompassed.
Type:
Grant
Filed:
February 27, 1998
Date of Patent:
August 7, 2001
Assignee:
International Business Machines Corporation
Inventors:
Donald W. Brouillette, Robert F. Cook, Thomas G. Ference, Wayne J. Howell, Eric G. Liniger, Ronald L. Mendelson