Abstract: An apparatus and method for calibrating a non-crystal oscillator in a transceiver unit using a crystal-oscillator includes the step of establishing a time base based upon oscillations of the crystal oscillator. A comparison of the number of oscillations for the non-crystal oscillator and the crystal oscillator is made during a known time period is made. An adjustment is determined based upon the established time base and the compared number of oscillations. The transceiving of the transceiver unit is then controlled based upon this adjustment.

Abstract: A wafer test head and ATE for testing semiconductor wafers. The wafer test head having a plurality of sides that can each be used to test a different semiconductor wafer. The architecture of the wafer test head enables electrical connections to probe card located on two different sides of the wafer test head. Multiple silicon wafers can be tested for proper functionality at the same time or in an interleaved fashion via a single multi-sided wafer test head. The internal architecture of an exemplary wafer test head allows printed circuit cards to be able to electrically connected to multiple wafer test locations on a single wafer test head.