Patents Represented by Attorney, Agent or Law Firm Hugh R. Kress
  • Method of fabricating and testing an embedded semiconductor device
    Patent number: 6194235
    Abstract: Methods and structures for pad reconfiguration to allow intermediate testing during the manufacture of an integrated circuit are disclosed. The methods and structures disclosed are particularly usefull in testing an embedded subcircuit, such as a memory array within an embedded chip product. A bond pad reconfiguration etch and other means for reconfiguring a bond pad are also disclosed.
    Type: Grant
    Filed: January 12, 2000
    Date of Patent: February 27, 2001
    Assignee: Micron Technology, Inc.
    Inventor: Manny Kin F. Ma