Abstract: In a semiconductor device including a carbon-containing electrode and a method for fabricating the same, an electrode has a high work function due to a carbon-containing TiN layer contained therein. It is possible to provide a dielectric layer having a high permittivity and thus to reduce the leakage current by forming an electrode having a high work function. Also, sufficient capacitance of a capacitor can be secured by employing an electrode having a high work function and a dielectric layer having a high permittivity.

Abstract: A semiconductor memory device includes a fuse set configured to form a current path including at least one of a plurality of fuses in response to address information corresponding to a plurality of memory cells and to output a redundancy address corresponding to a programming state of the plurality of fuses where the plurality of fuses are programmed with address information corresponding to a target memory cell to be repaired among the plurality of memory cells, and at least one current controlling unit configured to control a driving current flowing through the current path according to at least one detection signal.

Abstract: There is provided an output driver, which includes a pre-driver configured to generate a main driving control signal in response to a data signal, a main driver configured to drive an output terminal in response to the main driving control signal, an auxiliary driving control signal generator configured to generate an auxiliary driving control signal having an activation interval corresponding to the data signal and an interval control signal, and an auxiliary driver configured to drive the output terminal in response to the auxiliary driving control signal.