Abstract: An observed binary code sequence which has been corrupted by noise is operated upon to determine the configuration of a code generator capable of generating an equivalent code sequence. A method and apparatus is introduced to determine the code generator configuration based on rapid testing and elimination of a large set of hypothesis code generator configurations.
Abstract: A method and apparatus for detecting and measuring the code phase offset in bits and fractional bits, or the time delay in master clock cycles, between a reference binary pseudo-noise (PN) code sequence and a similar sequence of unknown delay. Rapid detection and measurement is achieved by utilizing parallel feed-forward logic and eliminating all feedback and variable delay circuitry. At the start of a new detection and measurement cycle, the current state of the A input sequence is stored and correlated with new B input stakes. Likewise the state of the B input sequence is stored and correlated with a new A input code states. After a time equal to the delay between the two input sequences, one of the correlators will produce an output. A time delay counter runs from the start of a new detection and measurement cycle and stops on the occurrence of a correlator output.
Abstract: An optically controlled semiconductor waveguide interferometer apparatus includes a Mach-Zehnder interferometer formed of semiconductor laser materials. A first optoelectronic switching means is adapted to be coupled across a first voltage potential and one of the optical paths of the interferometer. The first optoelectronic switching means has a first gap therein. Likewise, a second optoelectronic switching means is adapted to be coupled across a second voltage potential and the other of the optical paths. The second optoelectronic switching means has a respective gap therein. Light pulses are applied to the two gaps for controlling the index of refraction of the optical paths, whereby the light pulses control the interferometer so that the output intensity of the interferometer is modulated.
February 6, 1986
Date of Patent:
November 7, 1989
GTE Laboratories Incorporated
Ying C. Chen, Jia-ming Liu, Michael A. Newkirk
Abstract: A field effect transistor of the V-MOST type in which the channel region comprises a more highly doped part which adjoins the source zone and a lower doped part which surrounds said region, said channel region adjoining the surface and surrounded by an insulation diffusion. The lower-doped part is depleted from the pn junction with the low-doped drain region up to the surface at a voltage which is lower than the breakdown voltage.
January 16, 1979
Date of Patent:
November 11, 1980
U.S. Philips Corporation
Francois M. Klaassen, Johannes A. Appels