Abstract: A through-silicon via fabrication method includes etching a plurality of through holes in a silicon plate. An oxide liner is deposited on the surface of the silicon plate and on the sidewalls and bottom wall of the through holes. A metallic conductor is then deposited in the through holes. In another version, which may be used concurrently with the oxide liner, a silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate.
Type:
Grant
Filed:
December 22, 2010
Date of Patent:
December 11, 2012
Assignee:
Applied Materials, Inc.
Inventors:
Nagarajan Rajagopalan, Ji Ae Park, Ryan Yamase, Shamik Patel, Thomas Nowak, Li-Qun Xia, Bok Hoen Kim, Ran Ding, Jim Baldino, Mehul Naik, Sesh Ramaswami