Patents Represented by Attorney Jerry Cohen
  • Patent number: 7178513
    Abstract: A high energy inductive coil-per-plug ignition system operating at a higher voltage Vc than battery voltage Vb by use of boost-type power converter (1), using high energy density low inductance coils Ti which are further improved by partial encapsulation of the coils and by use of biasing magnets (120) in the large air gaps in the core to increase coil energy density, the coils connected to capacitive type spark plugs, with improved halo-disc type firing ends, by means of improved suppression wire (78), the system operated and controlled by a micro-controller (8) to generate and control the coil charge time Tch, the sequencing the spark firing, and other control features including finding the firing cylinder by simultaneous ignition firing and sensing during engine cranking, to provide a highly controlled and versatile ignition system capable of producing high energy flow-coupling ignition sparks with relatively fewer and smaller parts.
    Type: Grant
    Filed: April 19, 2003
    Date of Patent: February 20, 2007
    Inventor: Michael A. V. Ward
  • Patent number: 7115511
    Abstract: Method for removing and/or redistributing material in the trenches and/or vias of integrated circuit interconnect structures by a gas cluster ion beam (GCIB) is described to improve the fabrication process and quality of metal interconnects in an integrated circuit. The process entails opening up an undesired ‘necked in’ region at the entrance to the structure, re-depositing the barrier metal from thicker areas such as the neck or bottom of the structure to the side walls and/or removing some of the excess and undesired material on the bottom of the structure by sputtering. The GCIB process may be applied after the barrier metal deposition and before the copper seed layer/copper electroplating or the process may be applied after the formation of the copper seed layer and before electroplating. The method may extend the usability of the known interconnect deposition technologies to next generation integrated circuits and beyond.
    Type: Grant
    Filed: November 5, 2003
    Date of Patent: October 3, 2006
    Assignee: Epion Corporation
    Inventor: John J. Hautala
  • Patent number: 7114262
    Abstract: A horizontal sundial (1) that can be used to find standard time accurately and be manufactured on a commercial basis for any specific location, incorporating a gnomonic projection map (1M), a wire gnomon (1a) to indicate the time on a scale (1b), and the point of noon on the map (1c), and a bead (1d) located directly above the center of the dial for indicating the Sun's overhead position on the map (1e), and marking special occasions and special dates.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: October 3, 2006
    Inventor: William J. H. Andrewes
  • Patent number: 7067828
    Abstract: Methods and apparatus are disclosed for measuring controlling characteristics of clusters in a cluster ion beam, including average cluster ion velocity {overscore (v)}, average cluster ion mass {overscore (m)}, average cluster ion energy ?, average cluster ion charge state {overscore (q)}, average cluster ion mass per charge ( m q ) average , and average energy/charge ( E q ) average . The measurements are employed in gas cluster ion beam processing systems to monitor and control gas cluster ion beam characteristics that are critical for optimal processing of workpieces by gas cluster ion beam irradiation.
    Type: Grant
    Filed: January 27, 2004
    Date of Patent: June 27, 2006
    Assignee: Epion Corporation
    Inventor: David R. Swenson
  • Patent number: 7060988
    Abstract: Apparatus and methods for improving beam stability in high current gas-cluster ion beam systems by reducing the frequency of transients occurring in the vicinity of the ionizer through use of shielding conductors and distinct component electrical biasing to inhibit backward extraction of ions from the ionizer towards the gas-jet generator.
    Type: Grant
    Filed: March 17, 2005
    Date of Patent: June 13, 2006
    Assignee: Epion Corporation
    Inventors: Michael E. Mack, Robert K. Becker, Matthew C. Gwinn
  • Patent number: 7060989
    Abstract: Apparatus and methods for improving processing of workpieces with gas-cluster ion beams and modifying the gas-cluster ion energy distribution in the GCIB. In a reduced-pressure environment, generating an energetic gas-cluster ion beam and subjecting the beam to increased pressure region.
    Type: Grant
    Filed: March 18, 2005
    Date of Patent: June 13, 2006
    Assignee: Epion Corporation
    Inventors: David R. Swenson, John J. Hautala, Michael E. Mack, Martin D. Tabat, Matthew C. Gwinn
  • Patent number: 6831272
    Abstract: Methods and apparatus for measuring the distribution of cluster ion sizes in a gas cluster ion beam (GCIB) and for determining the mass distribution and mass flow of cluster ions in a GCIB processing system without necessitating the rejection of a portion of the beam through magnetic or electrostatic mass analysis. The invention uses time-of-flight measurement to estimate or monitor cluster ion size distribution either before or during processing of a workpiece. The measured information is displayed and incorporated in automated control of a GCIB processing system.
    Type: Grant
    Filed: July 13, 2001
    Date of Patent: December 14, 2004
    Assignee: Epion Corporation
    Inventors: Michael E. Mack, Richard P. Torti
  • Patent number: 6811582
    Abstract: A flowable, granular abrasive material and method of manufacture thereof. The material is comprised of at least one abrasive grain selected from aluminum oxide, silicon carbide, cubic boron nitride and/or diamond and has a organic or inorganic coating comprised of a binder and an abrasive filling material in the amounts of 0.5 to 8% and 1 to 15% by weight, respectively. The filling material may include sulfides, phosphates, carbonates, halogenides, and/or sulfide-, carbonate- and/or halogenide-containing complex compounds. The binder may include a low-viscosity phenol resin, epoxy resin and/or polyurethane resin.
    Type: Grant
    Filed: August 28, 2002
    Date of Patent: November 2, 2004
    Assignee: Treibacher Schleifmitte AG
    Inventors: Thomas Wurzer, Franz Skale
  • Patent number: 6812147
    Abstract: Reactive gas cluster ion beam processing using gas cluster ions comprising a mixture of gases cleans and/or etches the bottoms of electrical interconnect vias and/or trenches in integrated circuits to produce interconnect structures with lower contact resistances and better reliability than was previously achieved with conventional processes. In one embodiment, an electrical interconnect via structure uses a dielectric or high resistivity diffusion barrier material.
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: November 2, 2004
    Assignee: Epion Corporation
    Inventors: Wesley J. Skinner, John J. Hautala
  • Patent number: 6811765
    Abstract: The invention relates to a method for heat-treating fine-grained materials which tend to agglomerate at high temperatures and which have an average grain size of preferably 0 to 1000 &mgr;m within temperature ranges around and above the agglomeration temperature, in a fluidized bed of another, coarse-grained material. The temperature range in which the coarse-grained material tends to agglomerate and sinter to the reactor walls is higher than that of the fine-grained material. The coarse-grained material used is a material of the same type, a similar type or a different type with an average grain size of 1 to 10 mm. The fine-grained material is fed in directly over the tuyere bottom of a closed furnace chamber containing the fluidized bed, performs a circulating movement in said fluidized bed and once the heat treatment has been carried out, is pneumatically withdrawn from the fluidized bed into the top section of the furnace, and cooled immediately.
    Type: Grant
    Filed: August 15, 2000
    Date of Patent: November 2, 2004
    Assignee: Epion Corporation
    Inventors: Rolf Maiwald, Hans Zeiringer
  • Patent number: 6805807
    Abstract: A method of processing the surface of a workpiece using an adaptive gas cluster ion beam is disclosed. The invention provides a method of reducing the surface roughness and/or improving the surface smoothing of a workpiece by etching at various etch rates. The workpiece is initially processed with a gas cluster ion beam having an initial etch rate and then the beam is adjusted so that the workpiece is processed with one or more lower etch rates. The advantages are minimum required processing time, minimum remaining roughness of the final surface, and minimum material removal in order to attain a desired level of smoothness.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: October 19, 2004
    Assignee: Epion Corporation
    Inventor: David B. Fenner
  • Patent number: 6783261
    Abstract: An optical assembly for architectural illumination which includes a quasi point source surrounded by a collimating ring lens designed to radially project collimated beams. A segmented, off axis, parabolic reflector to collect and reflect light (not gathered by the collimating ring lens) as collimated beams and a ring reflector, the segments of which designed to gather beams from both the collimating ring lens and the off axis reflector and the direct them in substantially the same direction.
    Type: Grant
    Filed: June 4, 2003
    Date of Patent: August 31, 2004
    Inventor: Jerome H. Simon
  • Patent number: 6770874
    Abstract: The invention provides methods and apparatus for measuring the distribution of cluster ion sizes in a gas cluster ion beam (GCIB) and for determining the mass distribution and mass flow of cluster ions in a GCIB processing system without necessitating the rejection of a portion of the beam through magnetic or electrostatic mass analysis. The invention uses time-of-flight measurement to estimate or monitor cluster ion size distribution either before or during processing of a workpiece. The measured information is displayed and incorporated in automated control of a GCIB processing system.
    Type: Grant
    Filed: July 13, 2001
    Date of Patent: August 3, 2004
    Assignee: Epion Corporation
    Inventor: Jerald P. Dykstra
  • Patent number: 6750460
    Abstract: A system and method of precisely adjusting the properties of a device using a gas cluster ion beam (GCIB) are described. Use of the invention permits the precise removal or addition of small amounts of material without significantly damaging or degrading the performance of the device. The system is capable of adjusting the properties of a single device or multiple devices and the devices may be processed serially, in small groups, or all at once. The system is also capable of delivering a single dose or a variety of doses depending on the amount of material needed to be removed or added to adjust the properties.
    Type: Grant
    Filed: April 26, 2001
    Date of Patent: June 15, 2004
    Assignee: Epion Corporation
    Inventor: James A. Greer
  • Patent number: 6742249
    Abstract: Method of manufacture of a composite wiring structure for use with at least one semiconductor device, the structure having a first conductive member upon which the semiconductor device can be mounted for electrical connection thereto. A dielectric member, made of ceramic or organo-ceramic composite material, is bonded to the first conductive member and contains embedded therein a conductive network and a thermal distribution network. A second conductive member may be incorporated with the composite wiring structure, with a capacitor electrically connected between the conductive network and the second conductive member. Bonding between the dielectric member and the conductive members may be in the form of a direct covalent bond formed at a temperature insufficient to adversely effect the structural integrity of the conductive network and the thermal distribution network.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: June 1, 2004
    Inventors: L. Pierre deRochemont, Peter H. Farmer
  • Patent number: 6737643
    Abstract: A detector apparatus and its use for cluster ion beam diagnostics are described. The detector has a Faraday cup with a conductance path to a gas pressure detector and a conductance to the detector exit. The detector acquires ion current, which is a measure of the ion beam flux, and also acquires mass flux, through a pressure measurement. The pressure measurement responds to the mass of dissociated gas clusters and is combined with information about instantaneous ion current to estimate mean gas cluster ion size ({overscore (N)}i).
    Type: Grant
    Filed: March 19, 2001
    Date of Patent: May 18, 2004
    Assignee: Epion Corporation
    Inventors: Richard P. Torti, Matthew C. Gwinn, Jerald P. Dykstra
  • Patent number: 6723428
    Abstract: An anti-microbial and/or anti-fungal synthetic fiber and various products made partially or wholly therefrom. The fiber comprises various thermoplastic polymers and additives in a mono-component form or a bi-component form in either a core-sheath or side-by-side configurations. The anti-microbial synthetic fibers comprise inorganic anti-microbial additives, distributed in certain areas to reduce the amount of the anti-microbial agents being used, and therefore the cost of such fibers. The fibers can incorporate anti-microbial additives so that they are not removed by repeated washing in boiling water and in dry clean cycles and become ineffective and conversely enhance access to the additives by washing or the like. The fibers comprise high tenacity polymers (e.g. PET) in one portion and hydrolysis resistance polymers (e.g. PCT) in another portion with the additives. The fibers can further be blended with non-anti-microbial fibers such as cotton, wool, polyester, acrylic, nylon etc.
    Type: Grant
    Filed: May 5, 2000
    Date of Patent: April 20, 2004
    Assignee: Foss Manufacturing Co., Inc.
    Inventors: Stephen W. Foss, Dieter Keser, Alan Tefft, Robert V. Sawvell, Jr., Steven R. Brown, Gordon Goodwin, Jr., Arthur H. Cashin, James M. Parlier, Kim Goudreault
  • Patent number: 6721715
    Abstract: The present invention is a currency translation system that provides for the dynamic translation of a first currency value into a target currency value for the purpose of aiding localization and globalization of financial transactions. The system may be used as a standalone translation system or it may be embedded in a larger application such as a financial analysis program, a spreadsheet, a compound or object-loaded document, dynamic Web pages and other dynamically-generated content, databases or stored procedures, or a Web commerce program. The system takes as input the starting currency, a target currency, and transaction rules. The system maintains a database of currency rates, currency histories, conversion rules and currency representation data. Optimization and backtracking techniques are used to deal with partial rate information and in order to find optimal valuations involving a chain of currency translations.
    Type: Grant
    Filed: December 21, 1998
    Date of Patent: April 13, 2004
    Inventor: Martin A. Nemzow
  • Patent number: 6714553
    Abstract: A process and system for flexibly switching connections of data packet flows between nodes of data processing system networks by dividing data packets into cells and logically linking these cells on multiple queues of linked pointer lists.
    Type: Grant
    Filed: April 15, 1998
    Date of Patent: March 30, 2004
    Assignee: Top Layer Networks, Inc.
    Inventors: Nigel T. Poole, Joseph H. Brown, IV, Scott William Nolan, Barry A. Spinney, Richard L. Szmauz
  • Patent number: D488088
    Type: Grant
    Filed: July 24, 2002
    Date of Patent: April 6, 2004
    Inventor: Lena Vartanian