Patents Represented by Attorney, Agent or Law Firm Joanna G. Chin
  • Patent number: 6772370
    Abstract: A method and apparatus to generate test sequences for pipeline hazards in a pipelined data processing system is presented. An executable specification for the architecture is compiled that includes macroarchitecture and microarchitecture information corresponding to each of the instructions supported by the architecture. A table (20) is constructed from the executable specification that specifies the particular resource utilization parameters associated with each of the instruction types included in the instruction set supported. From this table a resource utilization parameter list (30) is compiled that indicates the relative times at which resources are needed by each instruction and when these resources are released by the instruction. Comparisons between different entries in the resource utilization parameter list corresponding to the same resource are performed such that potential hazards are detected.
    Type: Grant
    Filed: November 3, 2000
    Date of Patent: August 3, 2004
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Xiao Sun, John C. Chan
  • Patent number: 6691284
    Abstract: Embodiments of the present invention relate generally to the creation of characterized outputs for a digital cell based on an input circuit design and input parameters. These characterized outputs may then be used to create digital cell libraries. One embodiment relates to selecting values for the input parameters that result in a sufficiently accurate representation of a particular characterization of the digital cell. Another embodiment relates to selecting an appropriate subwindow (i.e. a window within a larger window defined by guaranteed success and guaranteed failure boundaries) used to determine characterized output values, such as constraint values. Yet another embodiment relates to a failure recovery method that may be applied when a selected window or subwindow results in an invalid window (i.e. a window that does not contain the actual output value being determined). The failure recovery method is therefore used to determine a valid window.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: February 10, 2004
    Assignee: Motorola, Inc.
    Inventor: Praveen Kashyap