Patents Represented by Attorney John F. Schippe
  • Patent number: 7623972
    Abstract: Methods and systems for determining if one or more target molecules are present in a gas, by exposing a functionalized carbon nanostructure (CNS) to the gas and measuring an electrical parameter value EPV(n) associated with each of N CNS sub-arrays. In a first embodiment, a most-probable concentration value C(opt) is estimated, and an error value, depending upon differences between the measured values EPV(n) and corresponding values EPV(n;C(opt)) is computed. If the error value is less than a first error threshold value, the system interprets this as indicating that the target molecule is present in a concentration C?C(opt). A second embodiment uses extensive statistical and vector space analysis to estimate target molecule concentration.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: November 24, 2009
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Jing Li, Meyya Meyyappan, Yijiang Lu