Patents Represented by Attorney John L. Imperato
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Patent number: 7861422Abstract: A skyline imaging system includes an image sensor and an inclination reference coupled to the image sensor. The inclination reference provides a righting moment for the image sensor and establishes a predetermined orientation for the image sensor relative to the Earth's gravity vector. A heading reference determines an azimuth heading for the image sensor.Type: GrantFiled: February 5, 2010Date of Patent: January 4, 2011Assignee: Solmetric CorporationInventor: Willard S. MacDonald
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Patent number: 7793356Abstract: A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal coupling system has a pre-stressed shape when the scanning probe is in a neutral position. The pre-stressed shape is designated to provide a characteristic impedance of the signal coupling system that varies linearly as a function of displacement of the scanning probe from the neutral position when the scanning probe is displaced, relative to the neutral position, over a designated range of displacements.Type: GrantFiled: September 11, 2008Date of Patent: September 7, 2010Assignee: Agilent Technologies, Inc.Inventors: Hassan Tanbakuchi, Matthew Richter, Michael Whitener
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Patent number: 7690123Abstract: A skyline imaging system includes an image sensor and an inclination reference coupled to the image sensor. The inclination reference provides a righting moment for the image sensor and establishes a predetermined orientation for the image sensor relative to the Earth's gravity vector. A heading reference determines an azimuth heading for the image sensor.Type: GrantFiled: August 22, 2007Date of Patent: April 6, 2010Assignee: Solmetric CorporationInventor: Willard S. MacDonald
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Patent number: 7684024Abstract: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.Type: GrantFiled: November 16, 2007Date of Patent: March 23, 2010Assignee: Agilent Technologies, Inc.Inventors: Gregory D. VanWiggeren, Douglas M. Baney
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Patent number: 7571339Abstract: A measurement system includes a clock recovery system and a measurement module coupled to the clock recovery system. The clock recovery system has an associated response characteristic. The clock recovery system receives an input signal and recovers a clock signal from the input signal. The measurement module is coupled to the clock recovery system and measures a phase error signal received from the clock recovery system, time-referenced to a trigger signal that is applied to the measurement module, where the phase error signal represents the phase difference between the input signal and the recovered clock signal. A processor applies the associated response characteristic to the measured phase error signal to determine the phase of the input signal.Type: GrantFiled: April 19, 2006Date of Patent: August 4, 2009Assignee: Agilent Technologies, Inc.Inventors: James R Stimple, Jady Palko
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Patent number: 7317519Abstract: A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.Type: GrantFiled: October 29, 2004Date of Patent: January 8, 2008Assignee: Agilent Technologies, Inc.Inventors: Gregory D. VanWiggeren, Douglas M. Baney
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Patent number: 7239256Abstract: An integrated calibration source and analog-to-digital converter are referenced to an analog ground. The calibration source provides a comb spectrum established by a sequence of bits that are repeatedly played back.Type: GrantFiled: February 1, 2006Date of Patent: July 3, 2007Assignee: Agilent Technologies, Inc.Inventor: Robin A Bordow
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Patent number: 7230714Abstract: A nonlinear filtering system determines the duration of a designated event in an SPR sensorgram, selects a filter length based on the determined duration of the designated event in the SPR sensorgram, and applies a nonlinear filter, having the selected filter length to the SPR sensorgram, to establish an output signal.Type: GrantFiled: October 22, 2004Date of Patent: June 12, 2007Assignee: Agilent Technologies, Inc.Inventors: Lee A. Barford, Gregory D. VanWiggeren
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Patent number: 7206340Abstract: A method and system characterize a random component of the jitter by designating an edge in the repetitive pattern, determining a slope of the designated edge, and acquiring a set of amplitude values at a different occurrences of the designated edge. A frequency domain representation of the set of amplitude values is then obtained, and identified peaks in the frequency domain representation are truncated. An RMS value, or other measure of random variations of the truncated representation is extracted and converted, based on the slope of the designated edge, to a corresponding RMS time jitter that represents the random component of the jitter. A periodic component of the jitter is characterized by determining the peak amplitude deviation of the acquired set of amplitude values, and then determining a periodic amplitude variation based on the RMS value, the peak amplitude deviation and the number of amplitude values in the set of amplitude values.Type: GrantFiled: January 29, 2003Date of Patent: April 17, 2007Assignee: Agilent Technologies, Inc.Inventors: Roger Lee Jungerman, Marlin Viss
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Patent number: 7102755Abstract: A method determines power of a modulated signal that is applied to a wavelength meter by summing bin values within a designated bin range of a frequency transformed interferogram representing the modulated signal and provided by the wavelength meter. In a first embodiment of the method, the bin range within which the bin values are summed is designated by mapping a series of signal characteristics indicative of the types of the modulated signals applied to the wavelength meter, to a series of bin spans within the frequency transformed interferograms that represent the modulated signals. The method then enables a selection of a signal characteristic from the series of signal characteristics to identify the modulated signal that is applied to the wavelength meter.Type: GrantFiled: February 22, 2002Date of Patent: September 5, 2006Assignee: Agilent Technologies, Inc.Inventors: David M Braun, Misty J Mesel
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Patent number: 7095294Abstract: A directional bridge coupler includes a coaxial balun having a coaxial cable with a plurality of ferrite beads disposed about an outer conductor of the coaxial cable, and a circuit substrate accommodating a directional bridge coupled to an output of the coaxial bridge. A conductive package having an internal cavity houses the circuit substrate and the coaxial balun. A polyiron saddle straddles a portion of the coaxial balun within the internal cavity of the conductive package.Type: GrantFiled: June 30, 2004Date of Patent: August 22, 2006Assignee: Agilent Technologies, Inc.Inventor: Uriel C. Fojas
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Patent number: 7064839Abstract: An optical phase standard includes a coupler dividing an applied optical signal between a measurement interferometer and a frequency reference branch. Resulting signals at the outputs of the measurement interferometer and the frequency reference branch are sampled. The samples acquired at the output of the frequency reference branch are mapped to optical frequencies that are traceable to a frequency standard provided by an absorption cell. This mapping determines the optical frequencies at which the samples acquired are at the output of the measurement interferometer. From the acquired samples at the output of the measurement interferometer, phase characteristics of a device under test (DUT) are extracted. Aspects of the optical phase standard are alternatively implemented according to an optical phase standardization method.Type: GrantFiled: April 30, 2003Date of Patent: June 20, 2006Assignee: Agilent Technologies Inc.Inventors: Paul E Bussard, Mark D Zinser, James R Stimple, Jeffrey Elmer Pape
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Patent number: 7061254Abstract: A power calibration method for a multi-port vector network analyzer (VNA) performs a two-port S-parameter calibration between a pair of ports of the multi-port VNA, and performs a power calibration of one of the ports in the pair of ports. From the two-port S-parameter calibration and the power calibration at the one port, power can be determined at one or more ports of a device under test (DUT) coupled to the ports of the multi-port VNA.Type: GrantFiled: May 12, 2005Date of Patent: June 13, 2006Assignee: Agilent Technologies, Inc.Inventors: Robert Edward Shoulders, David VerNon Blackham, Kenneth H. Wong
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Patent number: 7027676Abstract: Optical phase detection includes generating a first lightwave having a first polarization and a second lightwave having a polarization that is offset from the first polarization, and imposing a relative delay between the first and second lightwaves. The relative delay causes a frequency offset between the lightwaves as wavelength is tuned over a designated wavelength range. Directing the first and second lightwaves to a target provides a third lightwave and a fourth lightwave. A polarization component of the third lightwave and a polarization component of the fourth lightwave are detected to provide a detected signal at the frequency offset. The optical phase detection then includes extracting a phase difference, induced by the target, between the polarization components of the third and the fourth lightwaves.Type: GrantFiled: March 8, 2004Date of Patent: April 11, 2006Assignee: Agilent Technologies, Inc.Inventors: Gregory D. VanWiggeren, Daniel B. Roitman
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Patent number: 7010443Abstract: Noise power is measured within one or more designated frequency bands of an applied signal. The measurement includes frequency translating the applied signal by a set of equally spaced frequencies to form a corresponding set of intermediate frequency signals, measuring the noise in at least two measurement bands of each of the intermediate frequency signals that are separated by the frequency spacing of the equally spaced frequencies, and determining the noise power in the designated frequency band of the applied signal based on the noise measurements.Type: GrantFiled: October 31, 2003Date of Patent: March 7, 2006Assignee: Agilent Technologies, Inc.Inventors: Shigetsune Torin, Kenneth H. Wong, David VerNon Blackham
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Patent number: 6992531Abstract: A signal synthesizer includes a high frequency offset stage having a high frequency offset source and frequency translation element in the feedback path of a dual-oscillator offset loop synthesizer. The signal synthesizer achieves low phase noise via noise cancellation when used to provide the first local oscillator of a spectrum analyzer and when the second local oscillator of the spectrum analyzer provides the high frequency offset source to the signal synthesizer.Type: GrantFiled: October 6, 2003Date of Patent: January 31, 2006Assignee: Agilent Technologies, Inc.Inventor: Wing J. Mar
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Patent number: 6980915Abstract: A system and method compensate for phase noise of a spectrum analyzer based on an established model of the phase noise that accommodates a variety of operating states of the spectrum analyzer. The model is used to form an array that is applied to extract an output signal from measurement traces that are acquired by the spectrum analyzer.Type: GrantFiled: March 23, 2004Date of Patent: December 27, 2005Assignee: Agilent Technologies, Inc.Inventors: Joseph M. Gorin, Philip Ivan Stepanek
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Patent number: 6946910Abstract: A configurable feedback path is included in an amplitude control system having a signal source and an amplitude controller, and provides accurate tracking between a signal provided at a test port and a reference signal, whether or not the configurable feedback path is in an internally-leveled configuration or an externally-leveled configuration. The configurable feedback path includes a series of access ports, a detector that has an input coupled to the first access port, a filtered output coupled to the amplitude controller, and an unfiltered output providing the reference signal. The configurable feedback path also includes a signal separator that has an input terminal coupled to the signal source, a thru-terminal coupled to the third access port, and a coupled terminal that is coupled to the second access port. The fourth access port is coupled to the test port.Type: GrantFiled: August 29, 2002Date of Patent: September 20, 2005Assignee: Agilent Technologies, Inc.Inventor: Chen-Yu Chi
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Patent number: 6940922Abstract: In a response calibration method, a stimulus signal having a non-zero bandwidth is coupled to a receiver through a signal path that introduces distortion to the stimulus signal. The receiver acquires a first digital representation of the stimulus signal at an output of the signal path with the receiver adjusted to a first spectral position, and acquires a second digital representation of the stimulus signal at the output of the signal path with the receiver adjusted to a second spectral position that is shifted from the first spectral position by a predetermined frequency offset. The frequency response of the receiver when the receiver adjusted to the first spectral position is equated to the frequency response of the receiver when the receiver is adjusted to the second spectral position.Type: GrantFiled: October 10, 2001Date of Patent: September 6, 2005Assignee: Agilent Technologies, Inc.Inventor: Robert T. Cutler
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Patent number: 6884950Abstract: A MEMS switching system includes a power diverter interposed between a signal source and a bank of MEMS switches. The power diverter has an activated state wherein signal power from the signal source is diverted from the bank of MEMS switches, and a deactivated state wherein signal power from the signal source is not diverted from the bank of MEMS switches. A control signal selects between the activated state and the deactivated state of the power diverter.Type: GrantFiled: September 15, 2004Date of Patent: April 26, 2005Assignee: Agilent Technologies, Inc.Inventors: Dean B. Nicholson, Eric R. Ehlers