Abstract: A method for introgressing soybean cyst nematode resistance into elite soybean germplasm is disclosed. The method involves using genetically mapped loci associated with soybean cyst nematode resistance for marker-assisted selection during introgression of soybean cyst nematode resistance into elite soybean germplasm. Also disclosed are a method for confirming selection for soybean cyst nematode resistance; quantitative trait loci associated with soybean cyst nematode resistance; and soybean lines bred to be resistant to soybean cyst nematode infestation. Also disclosed is a method for using the mapped markers for positional cloning of soybean cyst nematode resistance genes.
Abstract: The present invention generally provides microfluidic devices which incorporate improved channel and reservoir geometries, as well as methods of using these devices in the analysis, preparation, or other manipulation of fluid borne materials, to achieve higher throughputs of such materials through these devices, with lower cost, material and/or space requirements.
Type:
Grant
Filed:
August 11, 1999
Date of Patent:
November 28, 2000
Assignee:
Caliper Technologies Corp.
Inventors:
Robert S. Dubrow, Colin B. Kennedy, Luc J. Bousse
Abstract: Laminates having microfluidic structures disposed between sheets of the laminate are provided. The microfluidic structures are raised on a sheet of laminate, typically by printing the structure on the sheet. Printing methods include Serigraph, ink-jet, intaligo, offset printing and thermal laser printing.
Abstract: The present invention generally provides microfluidic devices which incorporate improved channel and reservoir geometries, as well as methods of using these devices in the analysis, preparation, or other manipulation of fluid borne materials, to achieve higher throughputs of such materials through these devices, with lower cost, material and/or space requirements.
Type:
Grant
Filed:
August 11, 1999
Date of Patent:
May 30, 2000
Assignee:
Caliper Technologies Corp.
Inventors:
Robert S. Dubrow, Colin B. Kennedy, Luc J. Bousse