Patents Represented by Attorney Krong H. Macek

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  • Dynamic voltage scaling system
    Patent number: 7437580
    Abstract: Methods and apparatus for implementing a Dynamic Voltage Scaling (DVS) system are presented herein. In one embodiment, an embedded delay checker (EDC) cell is used to measure the actual activity and delay of a critical path within a microprocessor core, which is the basis for dynamically altering the voltage to the core. In another embodiment, a slaved ring oscillator (SRO) cell is placed adjacent to the microprocessor core and is used along with EDC cells to provide redundancy to a DVS system.
    Type: Grant
    Filed: May 5, 2004
    Date of Patent: October 14, 2008
    Assignee: QUALCOMM Incorporated
    Inventors: Eric L. Henderson, Michael Drop, Tauseef Kazi