Patents Represented by Attorney LaValle Ptak

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  • Purge apparatus for integrated circuit test system
    Patent number: 5636924
    Abstract: A purge head is provided for use with an integrated circuit test system to direct purge gases, such as nitrogen, to a circuit board on which a device under test is mounted while the device is subjected to below freezing temperatures. The purge head fits into the inner ring or aperture of the product load board to dispense the purge gases directly onto the circuit board on which the device under test is mounted to prevent moisture buildup during cold testing of the device under test.
    Type: Grant
    Filed: October 12, 1995
    Date of Patent: June 10, 1997
    Assignee: VLSI Technology, Inc.
    Inventors: Samuel E. McCracken, Leonard Ticey