Abstract: The present invention is apparatus for automatically unloading integrated circuit devices passing from a test site or test sites of an integrated circuit handler down one or more chutes (64). The apparatus includes a stacker assembly (26) comprising one or more hoppers (34). Further, an accumulator assembly (28) providing a plurality of accumulating apertures (62) formed between various loom elements (58, 60) is provided. A shuttle (50) receives an integrated circuit storage and transfer tube (42) from one of the hoppers (34) and transfers the tube (42) to a position relative to the accumulator assembly (28) wherein it can be lifted off the shuttle (50) and maintained in a column of tubes (42) in an accumulating aperture (62).