Patents Represented by Attorney Let Z. Kwan, Esq.
  • Patent number: 8091251
    Abstract: A high-speed measuring electronic digital outside micrometer allowing a user to make measurements quickly and effectively compared to conventional electronic outside micrometers with rotary thread spindles, which have limited measuring speed. This high-speed measuring electronic digital outside micrometer features: a linear motion digital sensor, a linear scale digital sensor, a linear motion digital sensor base, a digital display unit, an electronic processing unit, a micrometer body, a linear spindle, a linear spindle movement unit, a spindle control unit, a micrometer anvil, and retractable springs. In a stationary position, the measuring surface of the micrometer anvil and the linear spindle are in contact to the other. By operating the spindle control unit, it will create distance between the micrometer anvil and the linear spindle measuring surface. This distance is a measurable distance of the micrometer.
    Type: Grant
    Filed: November 14, 2010
    Date of Patent: January 10, 2012
    Inventors: Yanchen Zhang, Rene Roland Laferriere
  • Patent number: D574278
    Type: Grant
    Filed: December 14, 2006
    Date of Patent: August 5, 2008
    Assignee: International Precision Instruments Corp.
    Inventor: Yanchen Zhang
  • Patent number: D662842
    Type: Grant
    Filed: March 26, 2011
    Date of Patent: July 3, 2012
    Inventor: Meng Zhang