Patents Represented by Attorney Leudeka, Neely & Graham
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Patent number: 7839495Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable scan speed beam scanning subsystem, preferably using an acousto-optic deflector, with beam compensation, so that variable scanning speeds can be achieved. Also included are methods and systems for improving the signal to noise ratio by use of scatter reducing complements, and a system and method for selectively and repeatedly scanning a region of interest on the surface in order to provide additional observations of the region of interest.Type: GrantFiled: June 8, 2009Date of Patent: November 23, 2010Assignee: KLA-Tencor CorporationInventors: Bruce Baran, Chris L. Koliopoulos, Songping Gao, Richard E. Bills, Michael Murphree
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Patent number: 7781622Abstract: The present invention provides a process for direct hydroxylation of aromatic hydrocarbons like benzene to phenol, toluene to cresols and anisole to methoxy phenols by using hydrogen peroxide as environmentally benign oxidant in polar solvent like acetonitrile using vanadium phthalocyanine or its derivative as a catalyst, at a temperature in the range of 25-100° C.Type: GrantFiled: October 30, 2008Date of Patent: August 24, 2010Assignee: Council of Scientific & Industrial ResearchInventors: Suman Lata Jain, Jomy K. Joseph, Sweety Singhal, Bir Sain, Ragunathan Sivakumaran, Basant Kumar
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Patent number: 7684032Abstract: The disclosed system provides a method and apparatus for automated detection of a variety of defects within an epitaxial layer by way of an optical surface analysis device containing at least two wavelengths of incident light. A unique defect detection algorithm is provided for generating defect maps for each wavelength of incident light and merging each defect map into one overall defect map in order to detect all defects within an epitaxial layer. The present system is enabled for detecting defects within an epitaxial layer independent of the thickness of the epitaxial layer. Topography, scatter, and phase measurements can also be made in order to increase the accuracy of defect detection.Type: GrantFiled: January 6, 2005Date of Patent: March 23, 2010Assignee: KLA-Tencor CorporationInventor: Steven W. Meeks
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Patent number: 7614715Abstract: A method of controlling a micro fluid ejection device by sensing a middle zone temperature, and selectively applying an amount of power to a middle zone heater to achieve a target temperature. An edge zone temperature is also sensed and power is selectively applied to edge zone heaters to achieve a target temperature for the edge zones, whereby uniform ejection of fluid droplets along an ejector array may be achieved.Type: GrantFiled: June 7, 2007Date of Patent: November 10, 2009Assignee: Lexmark International, Inc.Inventor: Gregory Scott Woods
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Patent number: 7368396Abstract: A process for etching semiconductor substrates using a deep reactive ion etching process to produce through holes or slots (referred to collectively as “slots”) in the substrates. The process includes applying a first layer to a first surface of substrate to provide an etch mask material layer on the first surface of the substrate. A second layer is applied to a second surface of the substrate to provide an etch stop material layer on the second surface of the substrate. The first layer and the second layer have similar solubilities in one or more organic solvents. The substrate is etched from the first surface of the wafers to provide a slot in the substrate. After etching the substrate, the etch mask material layer and the etch stop material layer are removed by contacting the first surface and the second surface of the substrate with a single organic solvent.Type: GrantFiled: July 1, 2005Date of Patent: May 6, 2008Assignee: Lexmark International, Inc.Inventors: James M. Mrvos, Girish S. Patil, Karthik Vaideeswaran
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Patent number: 7364268Abstract: An improved photoimaged nozzle plate for a micro-fluid ejection head, a micro-fluid ejection head containing the nozzle plate, and methods for making a micro-fluid ejection head. The improved nozzle plate is provided by a photoresist nozzle plate layer applied to a thick film layer on a semiconductor substrate containing fluid ejector actuators. The photoresist nozzle plate layer has a plurality of nozzle holes therein. Each of the nozzle holes are formed in the nozzle plate layer from an exit surface of the nozzle plate layer to an entrance surface of the nozzle plate layer. Each of the nozzle holes has a reentrant hole profile with a wall angle greater than about 4° up to about 30° measured from an axis orthogonal to a plane defined by the exit surface of the nozzle plate layer.Type: GrantFiled: September 30, 2005Date of Patent: April 29, 2008Assignee: Lexmark International, Inc.Inventors: Brian C. Hart, Gary A. Holt, Jr., Melissa M. Waldeck, Sean T. Weaver, Gary R. Williams
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Patent number: 6651568Abstract: A table assembly of the type including a table top having a lower surface with a recessed central tray region and tray sides extending between the tray region and surrounding portions of the lower surface; leg assemblies mountable adjacent the lower surface and within the central tray region, each of the leg assemblies including a bracket having a plurality of mounts and at least two extensions adjacent edges of the bracket and positioned adjacent a portion of one of the tray sides; a leg pivotally mounted to the mounts; a plurality of frame members positioned so that a portion of each of the frame members is positioned between one of the extensions of the one of the brackets, and a fastener extending through each of the extensions and a portion of the adjacent frame member and into a portion of the tray side for mounting of the frame members and the leg assemblies to the table top.Type: GrantFiled: July 15, 2002Date of Patent: November 25, 2003Assignee: Maxchief Investments LimitedInventor: Steven A. Buono
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Patent number: 6421829Abstract: A method of making a face mask including the steps of providing a plurality of lengths of Grade 2, commercially pure titanium wire, having a diameter of from about 0.21 to about 0.24 inches; forming each length at room temperature to a desired bend angle by bending the member at room temperature using rotary bending apparatus to a first bend angle that is from about 1.25 to about 1.35 times greater than the desired bend angle; and welding each of the thus formed lengths to at least one other of the lengths in an ambient, oxygen containing environment.Type: GrantFiled: July 23, 2001Date of Patent: July 23, 2002Assignee: Mad PartnersInventors: P. David Halstead, Garry W. McNabb, David E. Wright
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Patent number: 5334843Abstract: A scintillator screen for an X-ray system includes a substrate of low-Z material and bodies of a high-Z material embedded within the substrate. By preselecting the size of the bodies embedded within the substrate, the spacial separation of the bodies and the thickness of the screen, the sensitivity of the screen to X-rays within a predetermined energy range can be predicted.Type: GrantFiled: August 17, 1992Date of Patent: August 2, 1994Inventor: Herbert D. Zeman
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Patent number: D624985Type: GrantFiled: July 2, 2009Date of Patent: October 5, 2010Assignee: EOD Technology, Inc.Inventors: Kerry L. Kreiman, Mark C. Englert, William R. Brown, Jr., Donald Ray Buttrey, Matthew G. Hughs
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Patent number: D411688Type: GrantFiled: February 12, 1998Date of Patent: June 29, 1999Inventor: John C. Horton