Patents Represented by Attorney Mark G. Abyad

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  • Event-driven test framework
    Patent number: 7647219
    Abstract: A modular instance-aware event-driven test framework is described. It includes an event-driven test framework, a transition-graph test model for the event-driven text framework, an instance-aware event-driven test framework built on said event-driven test framework and a transition-graph test model for said instance-aware event-driven test framework built on said transition-graph test model.
    Type: Grant
    Filed: July 11, 2005
    Date of Patent: January 12, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: James M. Overturf, Lajos Molnar