Abstract: A load cell for use in dynamic testing apparatus for mechanically testing samples includes an accelerometer mounted in the load cell on the same axis as the line of action of the mechanical force applied to the specimen under test. The resultant signal from the combination of the normal output from the load cell and the output from the accelerometer compensates for errors introduced by the mass of the moving grip used to grip the specimen in the apparatus.
Type:
Grant
Filed:
February 17, 1999
Date of Patent:
January 21, 2003
Assignee:
Instron Corporation
Inventors:
Raymond David Lohr, Paul Derek Hayford, Chanchal Singh Bahra