Abstract: A method and system to enhance accuracy of measurement of distance Z in a TOF system dynamically provides tight control over the phase and/or timing relationship of clock pulses used in the TOF system. Enhanced frequency control is imposed over a high speed oscillator whose output(s) control a timing generator, whose outputs are coupled to circuitry associated with the detection array in the TOF system, and with the TOF clock timing circuitry. The timing generator is coupled to a delay locked loop (DLL) and/or phase lock loop (PLL), which loop(s) are feedback coupled to the waveform circuit that drives the source of electromagnetic energy emitted by the TOF system.

Abstract: A pointing device includes a single control element to provide a user with absolute coordinate information and to enable user control of a computer cursor and emulation of mouse clicks. User movement of the single control element in an (x-y) plane preferably moves an optically reflective surface relative to an optical sensor system stationary within the device housing, such movement precluding rotation relative to the (x-y) plane. Mouse clicking may be emulated by moving the single control element up or down and/or by tilting relative to the (x-y) plane. Alternatively mouse clicking may be emulated by user activation of left and right sensor type switches or sensors. The device may be used by handicapped persons who can control cursor movement and mouse clicking using the single control element.

Abstract: CMOS implementable three-dimensional silicon sensors are fabricated using a standard fab but using augmented rules that create mask patterns not expressible with existing fab rules. Standard fab rules are not optimized to produce high quality three-dimensional silicon sensors. Accordingly, the normal set of rules does not permit creating the fab mask patterns necessary for high performance such sensors. However, the present invention can use the fab standard mask set with a rich set of fab instructions to express mask patterns from the mask set that would not otherwise be expressible. The resultant method enables high quality silicon sensors for three-dimensional sensing to be readily mass produced from a standard fab.

Abstract: Minority carrier bulk lifetime maps are accomplished using in-situ .mu.-PCD measurement techniques on a non-oxidized Si specimen of either polarity. Surface passivation of the specimen is accomplished chemically, preferably using a solution of iodine in ethanol with a concentration in the range of about 0.02 mol.multidot.dm.sup.-3 to about 0.2 mol.multidot.dm.sup.-3. For n-type specimens, a solution of concentrated alkaline such as ammonia, sodium- and potassium-hydroxide is especially effective. For either type specimens, a solution of HF at about 40% m/m is also effective. Surface passivation according to the present invention reduces surface recombination velocities to 10 cm/second or less. The specimen to be measured is placed in a container of passivation solution such that the specimen surfaces are covered with a solution film of about 1 mm or less. The container preferably is transparent to microwave and laser optical energy, and passivation and measurement can occur simultaneously.

Abstract: Geographical positional data is obtained for an underground object by locating the object using a device that locates underground objects. An apparatus that receives data from a global position system ("GPS") provides data identifying global position of the device, and thus also of the located underground object. A data storage unit stores such positional data, which may be used in the future to re-locate the underground object. The GPS-data receiving apparatus can preferably receive data from at least one overhead GPS satellite and from a secondary stationary receiver. Data from the secondary stationary receiver may be modulated on to a signal transmitted along a detected underground cable object.

Abstract: A latch-up pulse generator system includes a latch-up pulse generator coupled to first and second power supplies, for outputting JEDEC-standardized first and second output pulse trains. The generator includes a master clock, digital frequency dividers, and digitally controlled delay circuitry for outputting the two pulse trains. The first pulse train is a square-wave signal with a repetition rate of about two seconds. The second pulse train has a pulse width that is digitally controllable between about 0.2 .mu.s and 5 .mu.s. The delay between the fall-time of the second pulse train and the fall-time of the first pulse train is variably controlled between about 1 .mu.s and one second in 1 .mu.s steps. The amplitude and current output of each pulse train may range from 0 to perhaps 15 VDC at a current level of about 5 A. For power pin latch-up testing, the two pulse trains are combined to produce a composite pulse train. Signal and/or power pins of a CMOS device under test may be analyzed.