Abstract: A novel method for order processing, manufacturing and distributing integrated circuits (ICs) including the steps of: dry packing a plurality of programmable ICs and placing the dry packed programmable ICs into inventory such that the inventory is re-accessible in an automated manner. A plurality of configuration programs are stored and in response to orders from customers, a subset of the inventoried ICs are unpacked in order to process the order. The process then includes the steps of programming the unpacked ICs with a configuration selected by the customer and re-packing the programmed ICs for shipment.

Abstract: An electronic business card has a memory storing presentation slide images, a display that displays the images, and a processing device that governs the display process. The card has input devices (pads or buttons such as FORWARD, BACK and INDEX) allowing the user to control the display. The display's picture elements are preferably implemented as multi-chromic beads whose respective physical orientations are controlled by the processing device so as to form the viewed image. A method requires a target audience member to view at least one “payload” image (information that a presenter desires to propagate among a target audience), in association with at least one “hook” image (a quiz or game), on an electronic business card, PDA, or PC. The method includes presenting the payload image in association with the hook image, receiving and analyzing a user response, and displaying a reward image if the user response satisfies a criterion.

Abstract: A method and system for converting an architecture-specific design of a first type into an architecture-specific design of a second type such that race conditions and other anomalies are detected in the second type. By identifying routing delays in a first architecture and what those same routing delays would be in a second architecture, the method and system verify that a design has been properly converted. The method and system are applicable to the conversion of programmable interconnect logic devices to mask programmable logic devices. For example, a method for verifying timing for a design implemented in a new device when the design is to be moved from an old device. The method is particularly useful for verifying timing in a mask programmable device (HardWire) when the design is being converted from a field programmable device (FPGA).

Abstract: A fast, space-efficient lookup table (LUT) for programmable logic devices (PLDs) in which the write decoder, read decoder and memory block of the LUT are modified to improve performance while providing a highly efficient layout. Both the write decoder and the read decoder are controlled by LUT input signals, and data signals are transmitted directly to each memory circuit of the memory block (i.e., without passing through the write decoder). The read decoder includes a multiplexing circuit made up of a series of multiplexers that are directly controlled by the input signals received from the interconnect resources of the PLD. In one embodiment, a configurable logic block is provided with a single write decoder that is shared by a first LUT and a second LUT.

Abstract: A system and method for testing a circuit implemented on a programmable logic device. A host processor is coupled to the programmable logic device via an interface device, which has a plurality of signal pins for configuring the programmable logic device. Selected pins of the interface device are connected to selected input pins of the programmable logic device. Test vectors from the host processor are applied to the selected input pins of the programmable logic device via the interface device, and the states of one or more signals appearing on one or more output pins of the device are analyzed.

Abstract: A power control output circuit for a PLD that allows the PLD to selectively operate in either a low current (“normal”) output mode, or a high current power control mode. In one embodiment, the power control output circuit is incorporated into a special Input/Output Blocks (PC-IOB) of the PLD. When no power control function is needed, a high current output portion of the power control output circuit is deactivated by storing an associated data value a power control configuration memory cell of the PLD, and an output driver of the PC-IOB generates low current output signals on a device I/O terminal. To perform power control functions, a portion of the PLD's programmable logic circuitry is configured to generate a power control data signal, and the high current output portion of the power control output circuit is enabled by storing a corresponding data value in the power control configuration memory cell.

Abstract: An FPGA architecture and method enables partial reconfiguration of selected configurable logic blocks (CLBs) connected to an address line without affecting other CLBs connected to the same address line. Partial reconfiguration at a memory cell resolution is achieved by manipulating the input voltages applied to the address and data lines of an FPGA so that certain memory cells are programmed while other memory cells are not programmed. In addition, partial reconfiguration at a CLB resolution can be achieved by hardwiring the FPGA to enable selection of individual CLBs for reconfiguration.

Abstract: An integrated circuit (I/C) assembly includes a dedicated voltage sensor line for determining with a high degree of accuracy the operating voltage at a predetermined sensor point on the IC die. The dedicated voltage sensor line connects the sensor point to an input/output (I/O) structure of the IC die, which in turn is connected to a voltage sense pin on the package of the IC assembly. In this manner, an end user can accurately monitor the operating voltage at the voltage sensor point on the IC. Additionally, an end user can connect a control circuit to the voltage sensor pin to control either the supply voltage or secondary parameters.

Abstract: An improved CLB architecture, wherein the use of dedicated AND gates to generate a carry chain input signal facilitates low latency multiplication and makes efficient use of four-input function generators. In one embodiment of the invention, when multiplication using a binary addition tree algorithm is used, AND gates to implement single-bit multiplication are provided within the available function generators and duplicated in a dedicated AND gate accessible outside the corresponding function generator as a carry-chain input signal. In another embodiment, carry chain multiplexers can be selectively configured as AND or OR gates to facilitate certain arithmetic or comparison functions for the outputs of a plurality of function generators.

Abstract: A method and software apparatus for implementing a dynamically modifiable test flow for integrated circuit devices that adapts to the characteristics of each processed device lot. A modified set of tests sufficient to ensure proper device function for a particular lot is performed, reducing test costs and increasing test capacity. The method and system of the invention periodically samples a predetermined sample number of devices using a full set of tests including a set of skippable tests. Depending upon the performance characteristics of the sample device group on the skippable tests, a number of skippable tests are skipped during a modified test flow. After a next set of devices is tested using the modified test flow, the full set of tests is again performed on another sample group, and the size and makeup of the modified test flow is adjusted according to the new results.

Abstract: A method of specifying design parameters is provided for configuring circuits for programmable ICs. A design database describing a circuit is displayed in table-based format on a computer screen display. The design database may include a memory map including data to be placed in bit-storage space in the target programmable IC. This design database requires no schematics or HDL description of the circuit, even for complicated application-specific circuits. The desired parameters are entered by the user, typically using toggle buttons, pull-down menus, or keyboard entry. The selected parameters are then entered into the design database, thereby configuring the design database in accordance with the selected parameters. Next, the design database is transmitted over a data communications link such as the internet to a second computer, on which the compilation software resides. The design is then compiled and the resulting netlist is transmitted back to the originating computer.

Abstract: An field programmable gate array (FPGA) of cells arranged in rows and columns is interconnected by a hierarchical routing structure. Switches separate the cells into blocks and into blocks of blocks with routing lines interconnecting the switches to form the hierarchy. Also, select units for allowing memory bits to be addressed both individually and in large and arbitrary groups are disclosed. Further a control store for configuring the FPGA is addressed as an SRAM and can be dynamically reconfigured during operation.

Abstract: A method and system for converting an architecture-specific design of a first type into an architecture-specific design of a second type such that race conditions and other anomalies are detected in the second type. By identifying routing delays in a first architecture and what those same routing delays would be in a second architecture, the method and system verify that a design has been properly converted. The method and system are applicable to the conversion of programmable interconnect logic devices to mask programmable logic devices. For example, a method for verifying timing for a design implemented in a new device when the design is to be moved from an old device. The method is particularly useful for verifying timing in a mask programmable device (HardWire) when the design is being converted from a field programmable device (FPGA).

Abstract: A method and software apparatus are provided for implementing a dynamically modifiable test flow for integrated circuit devices that adapts to the characteristics of each processed device lot. According to the method of the invention, a modified set of tests sufficient to ensure proper device function for a particular lot is performed, reducing test costs and increasing test capacity. The method and system of the invention periodically samples a predetermined sample number of devices using a full set of tests including a set of skippable tests. Depending upon the performance characteristics of the sample device group on the skippable tests, a number of skippable tests are skipped during a modified test flow. After a next set of devices is tested using the modified test flow, the full set of tests is again performed on another sample group, and the size and makeup of the modified test flow is adjusted according to the new results.

Abstract: A test method for characterizing retention performance, both same state and opposite state performance, of ferroelectric capacitors includes the steps of writing an original complementary data state into first and second ferroelectric capacitors after the ferroelectric capacitors have been initialized into an initial valid data state. The first and second ferroelectric capacitors are then subjected to time and temperature stress. The original complementary data state from the first and second ferroelectric capacitors is then read, and same state charge (Q.sub.SS) information is collected. An opposite complementary data state is then written in the first and second capacitors. After a short time interval, possibly at an elevated temperature, the opposite complementary data state from the first and second ferroelectric capacitors is read to gather opposite state charge (Q.sub.OS) information. The original complementary data state is then written into the first and second ferroelectric capacitors.

Abstract: A logic element for an FPGA which can be configured as any one of a random access memory, a shift register and a lookup table. The logic element includes a plurality of memory cells which are interconnected such that the data output of each cell can serve as the input to the next memory cell. Thus the logic element effectively functions as a shift register. Shift registers of arbitrary length can be created by using a lookup table address multiplexer to select any memory cell output (not necessarily the last memory cell output) of the lookup table, and by chaining lookup tables of plural logic elements in series.

Abstract: An enhanced DRAM contains embedded row registers in the form of latches. The row registers are adjacent to the DRAM array, and when the DRAM comprises a group of subarrays, the row registers are located between DRAM subarrays. When used as on-chip cache, these registers hold frequently accessed data. This data corresponds to data stored in the DRAM at a particular address. When an address is supplied to the DRAM, it is compared to the address of the data stored in the cache. If the addresses are the same, then the cache data is read at SRAM speeds. The DRAM is decoupled from this read. The DRAM also remains idle during this cache read unless the system opts to precharge or refresh the DRAM. Refresh or precharge occur concurrently with the cache read. If the addresses are not the same, then the DRAM is accessed and the embedded register is reloaded with the data at that new DRAM address.

Abstract: An electrical connection arrangement for a programmable integrated circuit is provided. An electrical device is disposed proximate to a vertical longline which is used for transporting address and data signals. The electrical device includes a vertical address line extending from the device. A horizontally arranged interconnection line is electrically connected to the vertical address line extending from the device. Furthermore, the horizontally arranged interconnection line is programmably connectable to the vertical longline. By electrically hardwire connecting the horizontally arranged interconnection line to the vertical address line extending from the device, only one programmable interconnect point is required to transfer signals from the vertical longline into the electrical device itself. Thus, impedance is reduced, while addressing speed is improved. Also, by adding additional horizontal interconnect lines, the present invention reduces routing barriers.

Abstract: An incremental circuit design methodology using logic synthesis where comparisons are made between netlists corresponding to two separate versions of a design to determine similarities between the two. The similarities are then used to ensure the same physical implementation for the unchanged portion of the design. Therefore, information from the physical implementation of the previous design may be used in implementing the later design.

Abstract: A programmable switch for a field programmable gate array (FPGA) allows a user to reconfigure or partly reconfigure the FPGA from within the FPGA, allows an addressable configuration memory to be addressed through a set of pins for configuration and through user logic for reconfiguration. The same pins can be used for both configuration and user logic. Also signals such as chip enable and other control signals can be modified by user logic before performing their function so that chips external to the FPGA can be eliminated. Upon power-up of the chip, each programmable switch connects its pad to the programming logic which programs configuration memory, so that the programming logic can receive instructions from an external source and control programming of the core logic of the chip. The configuration memory programs not only the internal circuitry accessed by the user but also the programmable switch itself.