Patents Represented by Attorney, Agent or Law Firm Muranmatsu & Associates
  • Circuit structure for testing microprocessors and test method thereof
    Patent number: 6249892
    Abstract: A test circuit is capable of testing functions of a microprocessor without involving any performance penalty or substantial increase in area overhead.
    Type: Grant
    Filed: October 29, 1998
    Date of Patent: June 19, 2001
    Assignee: Advantest Corp.
    Inventors: Rochit Rajsuman, Hiroaki Yamoto