Abstract: The invention relates to a position measuring system for scanning a movement between a first element and a second element which is arranged in a moveable manner in relation to the first element. Said system comprises a material measure which can be fixed to the first element and has a scale carrier, and a scanning head which can be fixed to the second element and which scans a movement of the material measure in relation to the scanning head. The inventive system comprises a mount by which means the material measure and the scanning head can be fixed to each other in a pre-determined position, the scanning head being detachably fixed to the scale carrier. In order to assembly one such position measuring system on a first element and a second element moving in relation thereto, the scanning head is fixed to the material measure in such a way that the scanning head and the material measure are mutually fixed in position.
Type:
Grant
Filed:
November 9, 2001
Date of Patent:
June 14, 2005
Assignee:
Optolab Licensing GmbH
Inventors:
Hans-Joachim Freitag, Heinz-Guenther Franz, Andreas Schmidt