Abstract: A method for measuring the coupling capacitance between two interconnect lines of an integrated circuit structure having a ground plane. The steps include shorting the first and second lines together and measuring a first capacitance (Ct) between the ground plane and the shorted first and second lines; eliminating the short between the first and second lines; shorting the first line to the ground plane and measuring a second capacitance (C1) between the second line and the shorted ground plane and first line; eliminating the short between the first line and the ground plane; shorting the second line to the ground plane and measuring a third capacitance (Cc) between the first line and the shorted ground plane and second line; and determining the coupling capacitance between the first line and the second line according to the formula Cc=(C1+C2-Ct)/2.

Abstract: The invention comprises a surgical retractor having a barrel with a distal end and a handle. A plurality of retractor pods are located at a plurality of angles and positions on the lateral periphery of the barrel. The retractor pods are movable between a retracted position in which the pods are substantially flush with the surface of the barrel and an extended position in which each pod outwardly and laterally projects from the barrel. The handle is operatively connected to the pods to move the pods between the retracted and extended positions.