Abstract: A scanning boom microscope comprises an optical axis that can be varied into any axis or direction relative to a circular displacement about an optical boom that supports the scanning boom microscope's objective in free space. Accordingly, scanning boom microscope can be positioned to observe free standing samples away from the microscope base.
Type:
Grant
Filed:
January 20, 2006
Date of Patent:
July 21, 2009
Assignee:
JMAR Technologies, Inc.
Inventors:
Charles S. McLeod, Robert A. Selzer, Yunsheng Ma