Abstract: An innovative optical system and method is disclosed for analyzing and uniquely identifying high-order refractive indices samples in a diverse population of nearly identical samples. The system and method are particularly suitable for ultra-fine materials having similar color, shape and features which are difficult to identify through conventional chemical, physical, electrical or optical methods due to a lack of distinguishing features. The invention discloses a uniquely configured optical system which employs polarized sample light passing through a full wave compensation plate, a linear polarizer analyzer and a quarter wave retardation plate for producing vivid color bi-refringence pattern images which uniquely identify high-order refractive indices samples in a diverse population of nearly visually identical samples. The resultant patterns display very subtle differences between species which are frequently indiscernable by conventional microscopy methods.