Abstract: In one embodiment of the invention, a method for unified debug for simulation, includes: generating a transaction from a hardware verification language (HVL) testbench; copying signal states in the HVL testbench after the transaction is generated, wherein the signal states are copied in a hardware description language (HDL) mirror; generating a response to the transaction from a device-under-test (DUT); and displaying the signal states in the HVL testbench on a display screen as a first waveform, and displaying the DUT response on the display screen as a second waveform. In another embodiment of the invention, an apparatus is provided for unified debug for simulation, where the apparatus can perform the above method.
Type:
Grant
Filed:
October 11, 2005
Date of Patent:
July 17, 2007
Assignee:
Hewlett-Packard Development Company, L.P.
Abstract: Load demands in a power system are managed by determining whether load demands on one or more power system components need to be varied. If the load demands need to be varied, new load demands to be placed on the power system components are determined. The load demands on the power system components are controlled such that the load demands are substantially equal to the new load demands.
Type:
Grant
Filed:
September 30, 2003
Date of Patent:
June 26, 2007
Assignee:
Hewlett-Packard Development Company, L.P.
Inventors:
Keith Istvan Farkas, Cullen Edwin Bash, Parthasarathy Ranganathan
Abstract: A device for sensing at least one environmental condition in a data center. The device includes a chassis, a propelling mechanism, a power supply, a steering mechanism, and a controller supported on the chassis. The chassis also supports at least one environmental condition sensor and is operable to travel through the data center and sense at least one environmental condition at various locations throughout the data center.
Type:
Grant
Filed:
May 31, 2002
Date of Patent:
October 3, 2006
Assignee:
Hewlett-Packard Development Company, L.P.
Inventors:
Chandrakant D. Patel, Ratnesh K. Sharma, Cullen E. Bash, Abdlmonem H. Beitelmal