Abstract: An electrostatic discharge protection network that uses triple well semiconductor devices either singularly or in a series configuration. The semiconductor devices are preferably in diode junction type configuration. A control network can be used to control the biasing when the semiconductor devices are used in a series configuration.

Abstract: A method and system for providing communication between electronic devices that uses the phase of data transmitted between the devices to indicate logical one and zero values. The method and system has the added benefit of relieving the traditional limitations of voltage communication restraints between devices having differing core voltages (i.e. Differing generations).

Abstract: A method and apparratus for for identifying circuits within an integrated circuit design that are likely to latchup. The present invention accomplishes the identification by searching for suspect circuits and then modifying these circuits to represent a device known by an EDA tool (e.g. FET device). The EDA tool can then be used to determine the likelihood of latchup occuring based upon the modified device.

Abstract: A method and system for increasing the efficiency of packet processing within a packet protocol handler. In accordance with the method of the present invention packet processing tasks are performed on multiple processors or threads concurrently and in a pipelined fashion. Subsequent protocol packet processing tasks for processing a single packet are performed on multiple processors or threads, acting as stages of a pipeline. The assignment of tasks to processors or threads is performed dynamically, by checking the availability of a processor or thread in the subsequent pipeline stage. The availability determination includes determining the available capacity of the input work queue associated with each processor or thread. If the subsequent pipeline stage is overloaded, the task is assigned to another processor or thread that is not overloaded.

Abstract: In a first aspect, a method is provided for conserving power in a processing integrated circuit. The method includes the steps of (1) calculating power consumption for executing an instruction and data corresponding to the instruction; and (2) executing the instruction if such execution does not exceed a predetermined power level. In a second aspect, a method is provided for conserving power in a processing integrated circuit employing a plurality of execution units. The method includes the steps of (1) comparing a total power to be consumed by the processing integrated circuit to a power budget for the processing integrated circuit; and (2) if the total power exceeds the power budget, freezing execution of an instruction by one of the plurality of execution units so as to allow execution of the instruction to continue at a later time from where execution was frozen. Numerous other aspects are provided, as are systems and apparatus.

Abstract: An on-chip logic analysis (OCLA) system captures data processed by a signal processing logic core embedded in a single-chip-device (SOC) without interrupting operations of the signal processing logic core. The OCLA system includes a data capturing unit embedded in the SOC device to monitor the operations of the signal processing unit and determines whether the operations satisfy predetermined trigger conditions. Once the trigger condition is satisfied, the data capturing unit captures internal data from/to the signal processing unit and transfers to an external host system. The host system controls the operations of the data capturing unit. The host system provides the captured data to an user interface for testing and debugging the operations of the SOC signal processing device.

Abstract: An integrated circuit having either or both ESD and noise suppression devices that use the inherent resistance in the substrate as an ESD trigger and/or part of the noise suppression.

Abstract: A structure and associated method to determine an actual resistance value of a calibration resistor within a semiconductor device. The semiconductor device comprises a capacitor, a calibration resistor, and a calibration circuit. A voltage applied to the calibration resistor produces a current flow through the calibration resistor to charge the capacitor. The calibration circuit is adapted to measure an actual time required to charge the capacitor. The calibration circuit is further adapted calculate an actual resistance value of the calibration resistor based on the actual time required to charge the capacitor and a capacitance value of the capacitor.

Abstract: An integrated circuit, method and system providing finer granularity dynamic voltage control without performance loss. The invention provides a means for dynamically changing a voltage level of at least one stage on a critical path for a particular cycle. In this way, optimum voltages can be provided to the stages for the given expectation.

Abstract: A computer controlled user interactive display system having the customary provision of user access to the files stored therein through the display of a plurality of interactive objects which may be icons or even text representing the files usually in an arrangement of hierarchical screens. In addition, the system has means for displaying a set of high interactivity objects separate from the display of the plurality of objects. This set of high activity objects is developed through means for monitoring user interactivity with respect to basic plurality of interactive objects and means responsive to the monitoring means for selecting a set of high interactivity objects having user interactivity greater than selected levels. The system further includes means for displaying the set of high interactivity objects responsive to any file request so that the high interactivity objects are immediately displayed in response to any file request.

Abstract: An apparatus and method for blowing fuses in an integrated circuit. The apparatus and method use a plurality of fuse blowing circuits coupled serially. Each successive fuse blowing circuit is activated by an activate signal generated by a previous fuse blowing circuit. The apparatus and method provide for the fuse blowing operation to be both self-timing and self-testing.

Abstract: A level shifter circuit is disclosed. The level shifter circuit includes a first level shifter circuit and a second level shifter circuit. The first level shifter circuit and the second level shifter circuit are substantially identical with each other. The second level shifter circuit coupled to the first level shifter circuit via a couple of transistor to provide an output and a complementary output, respectively.

Abstract: A data processing system includes a central processing unit (CPU) in communication with a system memory. Within the system memory, there is stored legacy code that does not utilize the full features of the CPU. The data processing system also includes a code-optimizing coprocessor in communication with the CPU and the system memory. Control logic within the code-optimizing coprocessor causes the code-optimizing coprocessor to generate optimized code from the legacy code at the same time the CPU executes the legacy code, such that the optimized code is tailored according to the CPU. After the code-optimizing coprocessor has generated at least some optimized code, the code-optimizing coprocessor causes the CPU to automatically utilize at least some optimized code in lieu of at least some of the legacy code.

Abstract: Disclosed is a wide common mode range differential receiver comprising an input stage adapted to receive an input signal and its complement with wide common mode and output said signals as current signals; a plurality of self-cascode biasing stages adapted to receive said current signals and output a first analog differential voltage in phase with said input signal and a second analog differential voltage out of phase with said input signal; and a self-bias differential amplifier adapted to receive said first and second analog differential voltages and output an output signal with substantially reduced jitter.

Abstract: A way of dynamically modifying error recovery on a communications controller to operate at the lowest power mode allowed by current error rate conditions. When operating conditions are good and a small number of errors are detected, a low power error detection/correction mode is entered saving battery life. The low power error correction mechanism runs at a slower frequency and lower power than the high power mechanism and maintains the same data rate for the controller, thus saving power. Selecting the controller error (power) mode may be externally, such as by a person using a control dial on a cellular telephone when the voice data gets too noisy. Alternatively, the selection can be automatic, a critical error level detector internally making the selection.

Abstract: A method and apparatus for testing ADC circuitry. The method and apparatus detects infrequently occurring errors by providing a series of waveforms to the ADC that have different amplitude, frequency, or voltage offset from one another. The outputs of the ADC for the waveforms are then analyzed for timing related errors.

Abstract: A shorter gate length FET for very large scale integrated circuit chips is achieved by providing a wafer with multiple threshold voltages. Multiple threshold voltages are developed by combining multiple work function gate materials. The gate materials are geometrically aligned in a predetermined pattern so that each gate material is adjacent to other gate materials. A patterned linear array embodiment is developed for a multiple threshold voltage design. The method of forming a multiple threshold voltage FET requires disposing different gate materials in aligned trenches within a semiconductor wafer, wherein each gate material represents a separate work function. The gate materials are arranged to be in close proximity to one another to accommodate small gate length designs.

Abstract: A capacitor structure having a re-oxide layer on a nitride layer, wherein an interface between the nitride layer and the re-oxide layer includes electron traps. Characteristics of the carrier traps control a voltage output of the device. The thickness of the nitride layer and the re-oxide layer also control the voltage output. The nitride layer and a re-oxide layer form a dielectric capacitor. The dielectric capacitor undergoes a trap filled limit voltage, wherein a consistent voltage is output for a plurality of currents.

Abstract: An integrated circuit that includes a dynamic logic gate having an output node at which a logical output value of the logic gate is detected and also includes a circuit for selectable alteration of the soft error susceptibility of the dynamic logic gate.

Abstract: In order to reduce slew rate and minimize delay skew, the invention adds a pull-down booster circuit connected to the gate of the driving transistor and/or a pull-up booster circuit connected the gate of the driving transistor. The pull-down booster circuit is adapted to dynamically pull-down the voltage at the gate of the driving transistor when the voltage level at the input to the logical enable device changes from a first voltage (e.g., a logical “0”) to a second voltage (e.g., a logical “1”). The pull-up booster circuit is adapted to dynamically pull-up the voltage at the gate of the driving transistor when the voltage level at the input to the logical enable device changes from the second voltage to the first voltage.