Abstract: In accordance with the present invention, there is provided a method by which narrow lateral dimensioned microelectronic structures can be formed using low temperature processes. An uncured resist layer (e.g. PMMA 42) is deposited on a supporting layer (e.g. silicon 40) and patterned. Then, by using an isotropic process such as a low temperature chemical vapor deposition, a conformal layer (e.g. silicon oxynitride 44) is deposited substantially evenly on the vertical walls and on the horizontal surfaces of the uncured resist layer. An anisotropic etch such as reactive ion etching is then used to substantially remove the conformal layer from the horizontal surfaces without substantially etching the conformal layer from the vertical walls of the resist. The resist can then be selectively removed, producing isolated vertical sidewall structures (e.g. silicon oxynitride 46) which could be used, for example, as a negative tone mask. Alternatively, instead of removing the resist, another resist layer (e.g.
Abstract: A hybrid thermal detector (10, 110) includes a focal plane array (20, 120), a thermal isolation structure (40, 140), and an integrated circuit substrate (60, 160). The focal plane array (20, 120) includes thermal sensors (30, 130). The thermal isolation structure (40, 140) includes untrimmed mesa-type formations (44, 146, 148) and mesa strip conductors (42, 142, 144) that provide thermal isolation, signal transport, and structural support of the focal plane array (20, 120) when mounted on the integrated circuit substrate (60, 160). Hybrid thermal detector (10) includes a common electrode (28) which provides a bias voltage to all thermal sensors (30). Hybrid thermal detector (110) has electrically isolated thermal sensors (130), each thermal sensor (130) is supported by mesa strip conductors (142, 144), which provide a bias voltage to and receive a signal voltage from the thermal sensor (130).
Type:
Grant
Filed:
June 6, 1995
Date of Patent:
November 26, 1996
Assignee:
Texas Instruments Incorporated
Inventors:
William K. Walker, John P. Long, Robert A. Owen, Bert T. Runnels, Gail D. Shelton
Abstract: A hybrid thermal detector (10, 110) includes a focal plane array (20, 120), a thermal isolation structure (40, 140), and an integrated circuit substrate (60, 160). The focal plane array (20, 120) includes thermal sensors (30, 130). The thermal isolation structure (40, 140) includes untrimmed mesa-type formations (44, 146, 148) and mesa strip conductors (42, 142, 144) that provide thermal isolation, signal transport, and structural support of the focal plane array (20, 120) when mounted on the integrated circuit substrate (60, 160). Hybrid thermal detector (10) includes a common electrode (28) which provides a bias voltage to all thermal sensors (30). Hybrid thermal detector (110) has electrically isolated thermal sensors (130), each thermal sensor (130) is supported by mesa strip conductors (142, 144), which provide a bias voltage to and receive a signal voltage from the thermal sensor (130).
Type:
Grant
Filed:
June 30, 1994
Date of Patent:
November 12, 1996
Assignee:
Texas Instruments Incorporated
Inventors:
William K. Walker, John P. Long, Robert A. Owen, Bert T. Runnels, Gail D. Shelton
Abstract: A hybrid thermal detector (10, 110) includes a focal plane array (20, 120), a thermal isolation structure (40, 140), and an integrated circuit substrate (60, 160). The focal plane array (20, 120) includes thermal sensors (30, 130). The thermal isolation structure (40, 140) includes untrimmed mesa-type formations (44, 146, 148) and mesa strip conductors (42, 142, 144) that provide thermal isolation, signal transport, and structural support of the focal plane array (20, 120) when mounted on the integrated circuit substrate (60, 160). Hybrid thermal detector (10) includes a common electrode (28) which provides a bias voltage to all thermal sensors (30). Hybrid thermal detector (110) has electrically isolated thermal sensors (130), each thermal sensor (130) is supported by mesa strip conductors (142, 144), which provide a bias voltage to and receive a signal voltage from the thermal sensor (130).
Type:
Grant
Filed:
June 7, 1995
Date of Patent:
November 5, 1996
Inventors:
William K. Walker, John P. Long, Robert A. Owen, Bert T. Runnels, Gail D. Shelton
Abstract: A GaAs monolithic waveguide switch and system for low power consumption and high frequency switching wherein a single GaAs chip is flip-chip mounted onto a waveguide slot and inserted between interconnecting waveguides to provide single pole single throw switching. The GaAs chip includes an array of MESFETs along with connecting electrodes configured to provide low loss in the biased state and high loss in the unbiased state. The use of a single GaAs monolithic chip provides improved RF performance and manufacturability over discrete devices and provides lower power consumption as compared with silicon PIN diode waveguide switches.
Type:
Grant
Filed:
October 23, 1990
Date of Patent:
June 2, 1992
Assignee:
Texas Instruments Incorporated
Inventors:
Larry C. Witkowski, Hua Q. Tserng, Robert C. Voges, Charles M. Rhoads, Oren B. Kesler