Abstract: An on chip voltage monitor is provided for an integrated circuit having an analog to digital converter. In one form, the threshold voltage of a plurality of diode-connected test transistors is monitored by selectively positioning the transistors on an integrated circuit die. For each test transistor, a current source in response to a control circuit is selectively coupled thereto for sourcing predetermined amounts of current. The analog to digital converter in response to the control circuit is selectively coupled to the test transistor to measure the voltage across the test transistor. From this data, an accurate approximation of the threshold voltage may be made. Other voltages which are not easily externally measureable may be coupled to the on chip digital to analog converter for easy and accurate measurement.