Abstract: The present invention relates to a method and apparatus for ensuring uniform and reproducible heating of a deformation-tolerant substrate during low-pressure chemical vapor deposition (CVD) of a metal film on a surface of the substrate. The uniform and reproducible heating of the substrate is achieved in the present invention by positioning the substrate on a beveled surface of a chamfered ring which is located above the heating element in a CVD reactor chamber. The space between heating element, chamfered ring and bottom surface of the substrate define a cavity between the substrate and heating element that ensures that the substrate is heated by radiative means rather than direct contact.
Type:
Grant
Filed:
April 10, 2001
Date of Patent:
December 9, 2003
Assignee:
International Business Machines Corporation
Inventors:
Peter S. Locke, Sandra Guy Malhotra, Fenton Read McFeely, Andrew Herbert Simon, John Jacob Yurkas
Abstract: A method (and structure formed thereby) of forming a metal silicide contact on a non-planar silicon containing region having controlled consumption of the silicon containing region, includes forming a blanket metal layer over the silicon containing region, forming a silicon layer over the metal layer, etching anisotropically and selectively with respect to the metal the silicon layer, reacting the metal with silicon at a first temperature to form a metal silicon alloy, etching unreacted portions of the metal layer, annealing at a second temperature to form an alloy of metal-Si2, and selectively etching the unreacted silicon layer.
Type:
Grant
Filed:
April 18, 2001
Date of Patent:
November 11, 2003
Assignee:
International Business Machines Corporation
Inventors:
Cyril Cabral, Jr., Kevin K. Chan, Guy Moshe Cohen, Kathryn Wilder Guarini, Christian Lavoie, Paul Michael Solomon, Ying Zhang