Abstract: A reduced bitline precharge level has been found to increase the SRAM Beta ratio, thus improving the stability margin. The precharge level is also supplied to Sense amplifier, write driver, and source voltages for control signals. In the sense amplifier, the lower precharge voltage compensates for performance loss in the bit-cell by operating global data-line drivers with increased overdrive. In the write driver, the reduced voltage improves the Bitline discharge rate, improves the efficiency of the negative boost write assist, and decreases the reliability exposure of transistors in the write path from negative boost circuit.

Abstract: A crack stop void is formed in a low-k dielectric or silicon oxide layer between adjacent fuse structures for preventing propagation of cracks between the adjacent fuse structures during a fuse blow operation. The passivation layer is fixed in place by using an etch stop shape of conducting material which is formed simultaneously with the formation of the interconnect structure. This produces a reliable and repeatable fuse structure that has controllable passivation layer over the fuse structure that is easily manufactured.

Abstract: This patent describes a method for switching search-lines in a Content Addressable Memory (CAM) asynchronously to improve CAM speed and reduce CAM noise without affecting its power performance. This is accomplished by resetting the match-lines prior to initiating a search and then applying a search word to the search-lines. A reference match-line is provided to generate the timing for the search operation and provide the timing for the asynchronous application of the search data on the SLs. Additional noise reduction is achieved through the staggering of the search data application on the SLs through programmable delay elements.

Abstract: This patent describes a method for switching search-lines in a Content Addressable Memory (CAM) asynchronously to improve CAM speed and reduce CAM noise without affecting its power performance. This is accomplished by resetting the match-lines prior to initiating a search and then applying a search word to the search-lines. A reference match-line is provided to generate the timing for the search operation and provide the timing for the asynchronous application of the search data on the SLs. Additional noise reduction is achieved through the staggering of the search data application on the SLs through programmable delay elements.

Abstract: A binary latch that operates as an edge-triggered flip-flop and which is LSSD-testable that comprises an edge triggered master. The binary latch comprises an edge triggered master flip-flop (2), with a clock input connected to the system clock (SYS_CLK), with a data input (DI) and with an output (DO), a level sensitive scan design (LSSD) slave latch (3), connected to the output (DO) of the master flip-flop (2), a NAND gate (4) with a first input (41) connected to the system clock (SYS_CLK), a second input (42) connected to a test input (TEST) and with an output (43) connected to the LSSD slave latch clock input (LSSD_clk).

Abstract: A column redundancy system including a column redundancy apparatus for performing a redundancy swapping operation of column elements within the individual micro-cells. The column redundancy apparatus further includes a fuse information storage device, a first bank address decoding mechanism decodes a read bank address corresponding to a first micro-cell accessed for a read operation, and a second bank address decoding mechanism decodes a write bank address corresponding to a second micro-cell accessed for a write operation. If there is at least one defective column element contained within the first micro-cell, then the column redundancy apparatus generates an internal column address corresponding to the at least one defective column element in the first micro-cell.

Abstract: A column redundancy system including a column redundancy apparatus for performing a redundancy swapping operation of column elements within the individual micro-cells. The column redundancy apparatus further includes a fuse information storage device, a first bank address decoding mechanism decodes a read bank address corresponding to a first micro-cell accessed for a read operation, and a second bank address decoding mechanism decodes a write bank address corresponding to a second micro-cell accessed for a write operation. If there is at least one defective column element contained within the first micro-cell, then the column redundancy apparatus generates an internal column address corresponding to the at least one defective column element in the first micro-cell.

Abstract: A programmable data generator for generating input test data to be applied to a semiconductor memory array is disclosed. In an exemplary embodiment of the invention, the data generator includes a programmable address scramble register which has a plurality of storage locations associated therewith. The plurality of storage locations corresponds to array address bits associated with an address generator. A first exclusive OR (XOR) logic structure is coupled to the address generator and the address scramble register, wherein the first XOR logic structure generates an address-dependent, data scramble output signal that ultimately determines a data pattern to be applied to the memory array.

Abstract: An output driver circuit for a semiconductor chip has a push-pull output with a P-channel pull-up and an N-channel pull-down. Predrivers produce push-pull outputs for driving the gates of the output driver. Compensator circuits, one for the N-channel pull-down, and one for the P-channel pull-up, are used to prevent the transition from high-to-low or low-to-high from being too rapid, which could cause noise due to inductance of the package leads. A feedback circuit halts the operation of the compensator circuits after a short interval. An overvoltage circuit formed in a well of the semiconductor chip holding the driver circuit, having an input coupled to receive the data output of the predriver circuit going to the P-channel pull-up, also functions to prevent damage to the output driver circuit due to overvoltage on the output node.