Patents Represented by Attorney, Agent or Law Firm Robert Walsh, Esq.
  • TFI probe I/O wrap test method
    Patent number: 6731128
    Abstract: A structure for testing external connections to semiconductor devices. The structure includes an external electrical path between selected external connections on the semiconductor devices.
    Type: Grant
    Filed: January 4, 2002
    Date of Patent: May 4, 2004
    Assignee: International Business Machines Corporation
    Inventors: Gobinda Das, Franco Motika
  • Micro adjustable illumination aperture
    Patent number: 6268908
    Abstract: The distribution of ultraviolet light irradiated from an illumination source to optical elements of a projection exposure device is varied by an illumination aperture. The illumination aperture is formed with a plurality of openings which may be opened or closed independently to the passage of irradiating light. The size and shape of the opening formed by the plurality of openings of the illumination aperture is determined according to the particular image to be projected.
    Type: Grant
    Filed: August 30, 1999
    Date of Patent: July 31, 2001
    Assignee: International Business Machines Corporation
    Inventors: Orest Bula, Daniel C. Cole, Edward W. Conrad, David Vaclay Horak, Jed Hickory Rankin
  • Mechanical strength die sorting
    Patent number: 6222145
    Abstract: A method for sorting integrated circuit chips. At least one physical defect is detected in the semiconductor chips. The semiconductor chips are sorted based upon the physical defect.
    Type: Grant
    Filed: October 29, 1998
    Date of Patent: April 24, 2001
    Assignee: International Business Machines Corporation
    Inventors: Robert F. Cook, Eric G. Liniger, Ronald L. Mendelson, Dean R. Sanders