Patents Represented by Attorney Roeder & Broder
  • Patent number: 8254515
    Abstract: A method for measuring a phase locked loop bandwidth parameter for a high-speed serial link includes the steps of initiating a jitter frequency of a clock input of a phase locked loop equal to a reference frequency with a frequency generator; determining a reference jitter amplitude value of a clock output of the phase locked loop with a waveform analyzer at the reference frequency, the reference jitter amplitude value being a function of a time interval error jitter trend of the clock output at the reference frequency; and adjusting the jitter frequency of the clock input with the frequency generator until an adjusted jitter amplitude value of the clock output reaches a goal value as determined by the waveform analyzer, the adjusted jitter amplitude being a function of a time interval error trend of the clock output at the adjusted frequency.
    Type: Grant
    Filed: March 24, 2009
    Date of Patent: August 28, 2012
    Assignee: Integrated Device Technology, Inc.
    Inventors: Dongming Lou, Pengfei Hu, Junqiang Shang, Xin Liu