Abstract: A method for measuring a phase locked loop bandwidth parameter for a high-speed serial link includes the steps of initiating a jitter frequency of a clock input of a phase locked loop equal to a reference frequency with a frequency generator; determining a reference jitter amplitude value of a clock output of the phase locked loop with a waveform analyzer at the reference frequency, the reference jitter amplitude value being a function of a time interval error jitter trend of the clock output at the reference frequency; and adjusting the jitter frequency of the clock input with the frequency generator until an adjusted jitter amplitude value of the clock output reaches a goal value as determined by the waveform analyzer, the adjusted jitter amplitude being a function of a time interval error trend of the clock output at the adjusted frequency.
Type:
Grant
Filed:
March 24, 2009
Date of Patent:
August 28, 2012
Assignee:
Integrated Device Technology, Inc.
Inventors:
Dongming Lou, Pengfei Hu, Junqiang Shang, Xin Liu