Abstract: The present invention relates to a method and apparatus for improving the durability of a sensor, specifically one attached by an adhesive material to a subject. Specifically, the present invention discloses a method and apparatus for laminating a sensor and inserting the sensor into a protective shield for use. The shield includes some adhesive material to affix the sensor to the subject. A dirty, damaged, or worn out shield may be discarded and the sensor inserted into a new shield for continued use of the sensor.

Abstract: Apparatus and method are provided for determining and indicating if certain types of circuit failures have occurred in a D.C. motor circuit such as a locked rotor condition, a short-circuit or an open circuit. The method includes the steps of, and the apparatus involves applying a voltage to two leads of the D.C. motor sufficient to cause motor rotation, determining if flyback exists, determining if back EMF exists, and, finally, if a back EMF does not exist and flyback does exist then indicating a locked rotor condition. However, if a back EMF does not exist and flyback does not exist then an indication is provided that either an open-circuit or short-circuit condition exists. The same apparatus and method can be used with a voltage not sufficient to cause motor rotation, although given this limitation only flyback can be detected, so that only an open-circuit or short-circuit condition can be indicated.

Abstract: The present invention relates to a method and apparatus for improving the durability of a sensor, specifically one attached by an adhesive material to a subject. Specifically, the present invention discloses a method and apparatus for laminating a sensor and inserting the sensor into a protective shield for use. The shield includes some adhesive material to affix the sensor to the subject. A dirty, damaged, or worn out shield may be discarded and the sensor inserted into a new shield for continued use of the sensor.

Abstract: A system and method which assumes that the process being evaluated is written in a highly concurrent language or at least is capable of high degree of concurrent operations. The parameters employed in the simulated concurrent performance have a direct affect on performance time.