Patents Represented by Attorney Russ Weinzimmer, Esq.

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  • Mark quality inspection apparatus and method
    Patent number: 5859923
    Abstract: A machine vision system for inspection of a mark (such as a multi-character mark) on an IC device as shown. The system provides search and defect analysis for the mark, individual characters of the mark, and the foreground and the background of the mark. The system provides for search and defect analysis reports thereof. It includes components for operator training search and defect analysis models for the whole mark, and for automatic training of such models for individual characters of the mark.
    Type: Grant
    Filed: January 9, 1997
    Date of Patent: January 12, 1999
    Assignee: Cognex Corporation
    Inventors: John P. Petry, III, Len L. Picard