Patents Represented by Attorney, Agent or Law Firm Sam Pasternack, Esq.
  • Patent number: 6257989
    Abstract: Disclosed is a method and apparatus for estimating practice golf shot deviation and distance. The apparatus includes a base, an axle mounted to the base, a golf ball attached to the axle and a sensor coupled to the axle for determining motion thereof. When the golf ball is struck by a golf club, the ball and axle attached thereto rotate around a pivot point provided by the base. When the ball is struck such that it deviates from a plane that is perpendicular to the axle, the sensor detects motion of the axle along its axis. The magnitude and direction of deviation is estimated based upon the detected motion of the axle along its axis. The distance that the ball would have traveled is estimated based upon the detected speed with which the axle rotates.
    Type: Grant
    Filed: May 5, 1999
    Date of Patent: July 10, 2001
    Assignee: Dennco, Inc.
    Inventors: Angelo Tortola, James J. Dennesen
  • Patent number: 6228904
    Abstract: A nanocomposite structure comprising a nanostructured filler or carrier intimately mixed with a matrix, and methods of making such a structure. The nanostructured filler has a domain size sufficiently small to alter an electrical, magnetic, optical, electrochemical, chemical, thermal, biomedical, or tribological property of either filler or composite by at least 20%.
    Type: Grant
    Filed: May 22, 1998
    Date of Patent: May 8, 2001
    Assignee: Nanomaterials Research Corporation
    Inventors: Tapesh Yadav, Clayton Kostelecky, Evan Franke, Bijan Miremadi, Ming Au
  • Patent number: 6198293
    Abstract: The method for measuring the thickness of a material which transmits a detectable amount of microwave radiation includes irradiating the material with coherent microwave radiation tuned over a frequency range. Reflected microwave radiation is detected, the reflected radiation having maxima and minima over the frequency range as a result of coherent interference of microwaves reflected from reflecting surfaces of the material. The thickness of the material is determined from the period of the maxima and minima along with knowledge of the index of refraction of the material.
    Type: Grant
    Filed: March 26, 1998
    Date of Patent: March 6, 2001
    Assignee: Massachusetts Institute of Technology
    Inventors: Paul Woskov, David A. Lamar