Abstract: A semiconductor structure including at least one e-fuse embedded within a trench that is located in a semiconductor substrate (bulk or semiconductor-on-insulator) is provided. In accordance with the present invention, the e-fuse is in electrical contact with a dopant region that is located within the semiconductor substrate. The present invention also provides a method of fabricating such a semiconductor structure in which the embedded e-fuse is formed substantially at the same time with the trench isolation regions.
Type:
Grant
Filed:
November 30, 2005
Date of Patent:
June 3, 2008
Assignee:
International Business Machines Corporation
Inventors:
Louis L. Hsu, Jack A. Mandelman, William R. Tonti, Chih-Chao Yang