Abstract: A method for invoking an arbitrary sorting technique in a type-safe way. In one aspect, the method comprises the steps of providing a hierarchical schedule class comprising a schedule float subclass and a sorting schedule float subclass, subsumed by the schedule float subclass. The sorting schedule float subclass, in turn, comprises a schedule attribute class; a filter class; and a pair compare class. The method further includes using the hierarchical schedule class with each of an independent group consisting of a schedule attribute strategy, a filter strategy and a pair compare class strategy.
Type:
Grant
Filed:
July 20, 1995
Date of Patent:
July 28, 1998
Assignee:
IBM Corporation
Inventors:
Walter C. Dietrich, Jr., Thomas Robert Ervolina, John Peter Fasano, Jung-Mu Tang
Abstract: A method and system for optimizing a steady-state performance of a process having multiple inputs and multiple output-responses is provided. The method and system provide a unified and systematic way of optimizing nominal, statistical and multi-criteria performance of the process. The process can be inter alia a semiconductor manufacturing process or a business process.
Type:
Grant
Filed:
June 27, 1996
Date of Patent:
July 14, 1998
Assignee:
International Business Machines Corporation
Abstract: An assembly for measuring a trench depth parameter of a workpiece is disclosed. The assembly has an ultra-violet radiation source; a split fiber bundle having a first branch for propagating the ultra-violet radiation from the radiation source to a lens, and a second branch; a lens for focusing the UV radiation to the workpiece and refocusing an ultra-violet interference signal to the second branch; and a detector responsive to the ultra-violet interference signal received through the second branch. The detector transforms the ultra-violet interference signal to an electrical signal which is a measure of a trench depth of the workpiece. The ultra-violet interference signal is developed when ultra-violet radiation propagates through the workpiece and reflects from its base region to thereby interfere with ultra-violet radiation that is directly reflected by a workpiece surface which is different from the base region.
Type:
Grant
Filed:
April 30, 1996
Date of Patent:
November 25, 1997
Assignee:
IBM Corporation
Inventors:
Scott D. Halle, Philip Charles Danby Hobbs, Tadashi Mitsui, Theodore G. van Kessel, Hemantha Kumar Wickramasinghe