Abstract: The present invention pertains to a method of writing test data in a memory space within a memory store and includes: generating a header having an address representing the location of the memory space in the memory store, and a seed value; generating test data using the seed value; and storing the header and the test data in the memory space. Another embodiment of the present invention pertains to a method of testing a memory space within a memory store that includes: generating a header having an address representing the location of the memory space in the memory store, and a seed value; generating a set of values using the seed value; storing the header and the set of values in the memory space; retrieving data from the memory space; generating a new seed value using the set of values; and comparing the new seed value with the seed value.