Abstract: An input protection structure effectively protects input circuitry from positive-going ESD pulses. The input protection structure includes a transistor having a reduced beta, connected in series with one or more diodes between the input pin and VCC. In one embodiment, the transistor having reduced beta is constructed in the same manner as a fuse device. The structure is formed in an integrated fashion, without the need for metallic interconnections within the structure itself, thereby decreasing impedance while minimizing surface area in the integrated surface.