Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: An improved arrow rest for use in combination with an archery bow is disclosed. The present arrow rest provides complete radial support to an arrow disposed in a ready-to-draw position even if the bow is tilted or rotated radially relative to an axis of the arrow. Such radial support is provided by an inverted coil brush comprising a disc-shaped structure having a plurality of radially disposed, inwardly projecting bristles of a predetermined length attached therein forming a central opening in the arrow rest wherein the arrow shaft is radially supported. The bristles are arranged within the coil brush so as to impart no significant hindrance to the passage of an arrow therethrough. Thus, no angular orientation of the arrow vanes to the arrow nock is required which permits the use of the arrow rest with any configuration of arrow fletching or number of vanes.