Abstract: An abrasive free formulation for chemical mechanical polishing and method for using the formulation for polishing copper and related materials. The abrasive free formulation has a high removal rate on copper and a low removal rate on barrier material. The abrasive free formulation comprises at least an oxidizing agent and an activating agent.
Type:
Grant
Filed:
August 23, 2001
Date of Patent:
October 5, 2004
Assignee:
Advanced Technology Materials, Inc.
Inventors:
Ying Ma, Michael Jones, Thomas H. Baum, Deepak Verma, David Bernhard