Abstract: A random access memory device includes a number of memory cells, with word lines, plate lines, and bit lines coupled to the memory cells. A switch, controlled by a word line, couples one end of the plate line to a first global plate line, while another switch, controlled by a second global plate line, couples the one end of the plate line to a reference voltage. The plate lines are charged by the first global plate line, which improves operational speed of the device and reduces loading of the word lines.