Abstract: A high voltage electronic component test apparatus includes a test chamber containing a pair of electrodes across which a high voltage is applied and between which a component is placed in circuit by means of a movable component gripper assembly for the testing thereof. Voltage generating and electrical measurement apparatus is coupled to the electrodes for applying a high voltage thereacross and for measuring the resulting current within the electronic component. From the component testing, the remotely operated gripper assembly then removes the tested component from the test chamber and introduces another component for testing therein. A closed, circulating liquid-vapor system coupled to the test chamber introduces an electrically inert vapor, such as Freon or a fluorinated hydrocarbon, into the test chamber to prevent arcing and eliminate leakage currents therein.

Abstract: An arrangement for the automatic positioning of axial lead electronic components upon a walking beam includes a tray positioning mechanism and a tray removal mechanism. The tray positioning mechanism in positioned above the walking beam and includes a pair of facing end guides for receiving a plurality of component positioning trays in a stacked arrangement whereon are positioned a plurality of aligned electronic components. The tray positioning mechanism further includes a pair of vertically displaceable support rails for engaging each tray in turn and lowering it beneath the walking beam whereupon all of the components positioned on the tray are removed from the tray and are deposited upon the walking beam. The thus empty tray is then removed from a position adjacent to and straddling the walking beam by a roller assembly which sequentially displaces each emptied tray onto the tray removal mechanism.